Parallel sequence fault simulation for synchronous sequential circuits

被引:0
|
作者
Kung, CP [1 ]
Lin, CS [1 ]
机构
[1] NATL TAIWAN UNIV,DEPT ELECT ENGN,TAIPEI 107,TAIWAN
关键词
logic simulation; fault simulation; parallel sequence simulation;
D O I
10.1007/BF00134691
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel parallel sequence fault simulation (PSF) algorithm for synchronous sequential circuits is presented. The algorithm successfully extend the parallel pattern method for combinational circuits to sequential circuits by proposing a multiple-pass mechanism to overcome the state dependency in sequential circuits. The fault simulation is performed in parallel by partitioning the entire sequence into subsequences of equal length. Furthermore, techniques are developed to minimize the number of simulation passes. Notably, two compact counters, C-x and C-d, are proposed to faciliate the early stabilization detection of faulty circuit simulation with minimum space overhead. The experimental results on the benchmark circuits show that the speedup ratio over a serial sequence fault simulator based on ROOFS is 9.16 on average for pseudo random vectors. The parallel sequence algorithm of PSF is especially adaptable to parallel and distributed simulation which exploits sequence partition.
引用
收藏
页码:267 / 277
页数:11
相关论文
共 50 条
  • [31] TEST-GENERATION FOR SEQUENTIAL-CIRCUITS USING PARALLEL FAULT SIMULATION WITH RANDOM INPUTS
    TAKAMATSU, Y
    HIGASHI, I
    KODAMA, T
    SYSTEMS AND COMPUTERS IN JAPAN, 1995, 26 (10) : 24 - 34
  • [32] Data parallel sequential circuit fault simulation
    Amin, MB
    Vinnakota, B
    ISCAS 96: 1996 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS - CIRCUITS AND SYSTEMS CONNECTING THE WORLD, VOL 4, 1996, : 512 - 515
  • [33] A concurrent fault simulation for crosstalk faults in sequential circuits
    Phadoongsidhi, M
    Le, KT
    Saluja, KK
    PROCEEDINGS OF THE 11TH ASIAN TEST SYMPOSIUM (ATS 02), 2002, : 182 - 187
  • [34] Diagnostic simulation of sequential circuits using fault sampling
    Venkataraman, S
    Fuchs, WK
    Patel, JH
    ELEVENTH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS, 1997, : 476 - 481
  • [35] Theorems for efficient identification of indistinguishable fault pairs in synchronous sequential circuits
    Amyeen, ME
    Pomeranz, I
    Fuchs, WK
    20TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2002, : 181 - 188
  • [36] A parallel approach solving the test generation problem for synchronous sequential circuits
    Dahmen, HC
    Gläser, U
    Vierhaus, HT
    PARALLEL COMPUTING: FUNDAMENTALS, APPLICATIONS AND NEW DIRECTIONS, 1998, 12 : 549 - 556
  • [37] P+P: Parallel pattern and parallel fault simulator for synchronous sequential circuit
    Chen, HP
    Lu, Y
    Lin, ZH
    1996 2ND INTERNATIONAL CONFERENCE ON ASIC, PROCEEDINGS, 1996, : 380 - 383
  • [38] SCINDY: Logic crosstalk delay fault simulation in sequential circuits
    Phadoongsidhi, M
    Saluja, KK
    18TH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS: POWER AWARE DESIGN OF VLSI SYSTEMS, 2005, : 820 - 823
  • [39] A two-phase fault simulation scheme for sequential circuits
    Wu, WC
    Lee, CL
    Chen, JE
    JOURNAL OF INFORMATION SCIENCE AND ENGINEERING, 1998, 14 (03) : 669 - 686
  • [40] Diagnosing crosstalk faults in sequential circuits using fault simulation
    Takahashi, H
    Phadoongsidhi, M
    Higami, Y
    Saluja, KK
    Takamatsu, Y
    IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2002, E85D (10): : 1515 - 1525