Ionic conduction in zirconia films of nanometer thickness

被引：98

作者：

Guo, X ^{[1
]}

Vasco, E

Mi, SB

Szot, K

Wachsman, E

Waser, R

机构：

[1] Forschungszentrum Julich, Inst Festkorperforsch, D-52425 Julich, Germany

[2] Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32611 USA

来源：

ACTA MATERIALIA | 2005年 / 53卷 / 19期

关键词：

zirconia; nanostructure; electrical properties; laser deposition;

D O I：

10.1016/j.actamat.2005.07.033

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Polycrystalline 8 mol% Y2O3-stabilized ZrO2 films with thicknesses of 12 and 25 nm were deposited on (100) MgO substrates, their nanostructures were investigated by means of transmission electron microscopy (TEM), high-resolution TEM and atomic force microscopy, and the electrical properties of the nanostructured films were characterized in dry and humid O-2. Compared with microcrystalline bulk ceramics, the ionic conductivity of the nanostructured films is lower by about a factor of 4, which is mainly due to the lower bulk conductivity and the low grain-boundary conductivity. There is not remarkable proton conduction in the nanostructured films when annealed in water vapor, and the influence of the ZrO2/MgO interface on its ionic conduction is negligible. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：5161 / 5166

页数：6

共 23 条

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