Using syndrome compression for memory built-in self-diagnosis

被引：0

作者：

Li, JF ^{[1
]}

Tzeng, RS ^{[1
]}

Wu, CW ^{[1
]}

机构：

[1] Natl Tsing Hua Univ, Dept Elect Engn, Hsinchu 30055, Taiwan

来源：

2001 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS, AND APPLICATIONS, PROCEEDINGS OF TECHNICAL PAPERS | 2001年

关键词：

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

Due to the pin-count limitation, built-in self-diagnosis (BISD) for embedded RAMs usually exports diagnosis information serially, which results in the overhead of diagnostic time. This paper describes a tree-based compression technique for word-oriented memories. The technique can speed up the transmission of diagnosis data from the embedded RAM with BISD support. By using a simplified Huffman coding scheme and partitioning each 256-bit Hamming syndrome into fixed-size symbols, the average compression ratio is reduced to about 10%, assuming 16-bit symbols. The proposed compression technique reduces the time for diagnostic test, as well as the tester storage requirement.

引用

页码：303 / 306

页数：4

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