Transverse C-band deflecting structure for longitudinal electron-bunch-diagnosis in XFEL "SACLA"

被引：19

作者：

Ego, H. ^{[1
]}

Maesaka, H. ^{[2
]}

Sakurai, T. ^{[2
]}

Otake, Y. ^{[2
]}

Hashirano, T. ^{[3
]}

Miura, S. ^{[3
]}

机构：

[1] Japan Synchrotron Radiat Res Inst JASRI, Sayo, Hyogo, Japan

[2] RIKEN SPring 8 Ctr, Sayo, Hyogo, Japan

[3] Mitsubishi Heavy Ind Ltd MHI, Mihara, Hiroshima, Japan

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2015年 / 795卷

关键词：

Deflecting structure; HEM11; C-band; Longitudinal profile; Femtosecond; FEL;

D O I：

10.1016/j.nima.2015.06.018

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In the 8 GeV compact X-ray FEE "SACLA," a single bunch of electrons is compressed to a duration of approximately 30 fs to yield a peak current of 3 kA, which creates brilliant self-amplified spontaneous emission. To measure the longitudinal profile of an ultrashort electron bunch and verify the compression, we developed a high-gradient C-band RF deflecting structure 1.8 m long and periodically loaded with racetrack-shaped irises. The irises generated a high deflection gradient for the vertically deflecting HEM11-5 pi/6 dipole mode and suppressed rotation of the deflection plane. The two structures were fabricated and generated a stable total deflecting voltage exceeding 60 MV and revealed the longitudinal electron-bunch profile with an effective time resolution of approximately 10 fs. (C) 2015 Elsevier B.V. All rights reserved.

引用

页码：381 / 388

页数：8

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