Comparison of optoelectrical characteristics between Schottky and Ohmic contacts to β-Ga2O3 thin film

被引:56
作者
Liu, Zeng [1 ,2 ]
Zhi, Yusong [1 ,2 ]
Li, Shan [1 ,2 ]
Liu, Yuanyuan [3 ,6 ]
Tang, Xiao [4 ]
Yan, Zuyong [1 ,2 ]
Li, Peigang [1 ,2 ]
Li, Xiaohang [4 ]
Guo, Daoyou [5 ]
Wu, Zhenping [1 ]
Tang, Weihua [1 ,2 ]
机构
[1] Beijing Univ Posts & Telecommun, Lab Informat Funct Mat & Devices, Sch Sci, Beijing 100876, Peoples R China
[2] Beijing Univ Posts & Telecommun, State Key Lab Informat Photon & Opt Commun, Beijing 100876, Peoples R China
[3] Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China
[4] KAUST, Adv Semicond Lab, Thuwal 239556900, Saudi Arabia
[5] Zhejiang Sci Tech Univ, Dept Phys, Ctr Optoelect Mat & Devices, Hangzhou 310018, Peoples R China
[6] Chinese Acad Sci, Inst Semicond, Engn Res Ctr Semicond Integrated Technol, Beijing 100083, Peoples R China
基金
中国国家自然科学基金;
关键词
beta-Ga2O3; Schottky and Ohmic contacts; optoelectrical characteristics; metal-organic chemical vapor deposition (MOCVD); SOLAR-BLIND PHOTODETECTOR; ULTRAVIOLET PHOTODETECTORS; BARRIER DIODES; TRANSPORT; OXIDE; INTERFACES; NANOWIRES;
D O I
10.1088/1361-6463/ab596f
中图分类号
O59 [应用物理学];
学科分类号
摘要
Schottky and Ohmic contacts are key matters affecting carrier transport in oxide semiconductor-based electrical and optical devices. For Ga2O3, the comparison of optoelectrical behaviors and the fundamental physical mechanism between these two contacts are not well known yet. In this work, beta-Ga2O3 thin films were grown via metal-organic chemical vapor deposition then deposited with symmetrical Ni/Au (Schottky) or Ti/Au (Ohmic) contacts. Optoelectrical measurements show that the Ohmic contacted device exhibits superior responsivities thanks to its higher photocurrents. Meanwhile, for the Schottky contacted device, firstly, it has a faster response speed, and secondly it exhibits larger photo-to-dark current ratios owing to their low dark current. Specifically, the voltage- and light intensity-dependent responsivity and detectivities of the Schottky and Ohmic contacted devices were measured and discussed under the consideration of different voltages and UV light intensities.
引用
收藏
页数:8
相关论文
共 72 条
[51]   Brillouin zone and band structure of β-Ga2O3 [J].
Peelaers, Hartwin ;
Van de Walle, Chris G. .
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2015, 252 (04) :828-832
[52]   High-Performance Metal-Organic Chemical Vapor Deposition Grown ε-Ga2O3 Solar-Blind Photodeterctor With Asymmetric Schottky Electrodes [J].
Qin, Yuan ;
Sun, Haiding ;
Long, Shibing ;
Tompa, Gary S. ;
Salagaj, Tom ;
Dong, Hang ;
He, Qiming ;
Jian, Guangzhong ;
Liu, Qi ;
Lv, Hangbing ;
Liu, Ming .
IEEE ELECTRON DEVICE LETTERS, 2019, 40 (09) :1475-1478
[53]   Semiconductor ultraviolet detectors [J].
Razeghi, M ;
Rogalski, A .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (10) :7433-7473
[54]   Unravelling Small-Polaron Transport in Metal Oxide Photoelectrodes [J].
Rettie, Alexander J. E. ;
Chemelewski, William D. ;
Emin, David ;
Mullins, C. Buddie .
JOURNAL OF PHYSICAL CHEMISTRY LETTERS, 2016, 7 (03) :471-479
[55]  
Rose A, 1963, CONCEPTS PHOTOCONDUC
[56]   A Comprehensive Review of Semiconductor Ultraviolet Photodetectors: From Thin Film to One-Dimensional Nanostructures [J].
Sang, Liwen ;
Liao, Meiyong ;
Sumiya, Masatomo .
SENSORS, 2013, 13 (08) :10482-10518
[57]   Ga2O3 Schottky Barrier Diodes Fabricated by Using Single-Crystal β-Ga2O3 (010) Substrates [J].
Sasaki, Kohei ;
Higashiwaki, Masataka ;
Kuramata, Akito ;
Masui, Takekazu ;
Yamakoshi, Shigenobu .
IEEE ELECTRON DEVICE LETTERS, 2013, 34 (04) :493-495
[58]   For the theory of semiconductor junction and peak rectifier . [J].
Schottky, W. .
ZEITSCHRIFT FUR PHYSIK, 1939, 113 (5-6) :367-414
[59]   Influence of Oxygen Deficiency on the Rectifying Behavior of Transparent-Semiconducting-Oxide-Metal Interfaces [J].
Schultz, Thorsten ;
Vogt, Sofie ;
Schlupp, Peter ;
von Wenckstern, Holger ;
Koch, Norbert ;
Grundmann, Marius .
PHYSICAL REVIEW APPLIED, 2018, 9 (06)
[60]  
Splith D., 2018, P SOC PHOTO-OPT INS