Effect of Ta Buffer Layer on the Structural and Magnetoelectricity Characteristic of Ultrathin NiCo Films

NiCo and Ta/NiCo films were grown on glass substrates with magnetron sputtering,and the effect of Ta buffer layer on the structural and magnetoelectricity chatacter of NiCo films with different thickness were studied. When the thickness of NiCo fims are thicker than 15nm,the distinctness fcc (111) peaks were found in the films with Ta buffer layer,but the (111) peaks can't be found in the films without Ta buffer layer by the x-ray diffraction (XRD). The atomic force microscopy (AFM) results indicate that the surface of NiCo films with Ta buffer layer are smoother than the NiCo films without Ta buffer layer. The vibrating sample magnetometer ( VSM) results show that the both NiCo films existed magnetic anisotropy The anisotropic magnetoresistance (AMR) of NiCo films can be improved by Ta buffer layer.