Enhanced energy storage capability of (1-x)Na0.5Bi0.5TiO3-xSr0.7Bi0.2TiO3 free-lead relaxor ferroelectric thin films

In today's global traditional energy shortage environment, developing renewable and environmental-friendly energy has become a trend. In this work, the (1-x)Na0.5Bi0.5TiO3-xSr(0.7)Bi(0.2)TiO(3) ((1-x)NBT-xSBT, x = 0.2, 0.3, 0.4, and 0.5) relaxor ferroelectric thin films are grown on Pt/Si/SiO2 substrate via the sol-gel method. The structure, dielectric properties, energy density, thermal stability, frequency stability, and fatigue endurance for long-term stability of the (1-x)NBT-xSBT thin films are studied systematically. The experimental results demonstrate that the NBT-0.5SBT thin film exhibits an excellent discharge energy density (W-rec similar to 35.014 J/cm(3)) and efficiency (eta similar to 73.8%) under 3200 kV/cm at room temperature (RT). More importantly, the corresponding thin film display superior the thermal stability (20-140 degrees C), frequency stability (10(2)-10(4) Hz), and fatigue endurance for long-term stability (10(4 )st). Therefore, this contribution will provide a convenient and efficient way for preparing high-performance dielectric capacitors for application in power pulse systems.