Reckoning electromagnetic principles with polarimetric measurements of anisotropic optically active crystals

被引：32

作者：

Arteaga, Oriol ^{[1
]}

Freudenthal, John ^{[1
]}

Kahr, Bart ^{[1
]}

机构：

[1] NYU, Dept Chem, New York, NY 10003 USA

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2012年 / 45卷

基金：

美国国家科学基金会;

关键词：

ACCURACY UNIVERSAL POLARIMETER; NON-ENANTIOMORPHOUS CRYSTAL; JONES MATRIX-METHOD; OBLIQUE-INCIDENCE; LAYERED MEDIA; MULTIPLE REFLECTIONS; SILVER THIOGALLATE; LIGHT-PROPAGATION; ALPHA-QUARTZ; BIREFRINGENCE;

D O I：

10.1107/S0021889812006085

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A method is introduced to correlate electromagnetic theory and polarimetric experiments for anisotropic optically active crystals at oblique angles of incidence. It is based on the 4 x 4 algebraic descriptions of light propagation in layered anisotropic media, which can be simplified to 2 x 2 matrices when multiple reflections are disregarded. Spectroscopic Mueller matrix measurements in transmission and at oblique angles of incidence have been made on two uniaxial crystals: alpha-quartz and silver thiogallate. Their optical activity tensors have been spectroscopically determined using the method presented here.

引用

页码：279 / 291

页数：13

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