Rapid thickness reading of CH3NH3PbI3 nanowire thin films from color maps

被引：4

作者：

Spina, Massimo ^{[1
]}

Grimaldi, Claudio ^{[1
]}

Nafradi, Balint ^{[1
]}

Forro, Laszlo ^{[1
]}

Horvath, Endre ^{[1
]}

机构：

[1] Ecole Polytech Fed Lausanne, LPMC, CH-1015 Lausanne, Switzerland

来源：

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2016年 / 213卷 / 08期

基金：

欧洲研究理事会;

关键词：

CH3NH3PbI3; nanowires; optical properties; thickness; thin films; PEROVSKITE SOLAR-CELLS; IMAGING ELLIPSOMETER; HALIDE PEROVSKITE; TEMPERATURE; PERFORMANCE; DEPOSITION;

D O I：

10.1002/pssa.201533067

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Hybrid halide perovskite photovoltaic materials show a remarkable light conversion efficiency in various optoelectronic devices. In the fabrication of these solar cells, light emitting diodes, laser and photodetector prototypes the thickness of the perovskite is an important parameter since the light is absorbed within a thin layer of a few hundred nanometers. Nevertheless, making perovskite coatings with various solution-based and evaporation methods showing highly reproducible thickness and area coverage is still an issue. Therefore, rapid and reliable quality-control of the film morphology is needed. This report shows a simple, rapid, and calibration-free method for reading the thickness directly from the color map of nanowire perovskite films seen in standard optical microscope with visible light. (C) 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

引用

页码：2017 / 2023

页数：7

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