A similar-matrix-matched calibration strategy by using microsecond pulsed glow discharge mass spectrometry in the application of purity analysis of high purity lanthanum oxide

被引：3
作者：
Zhan, Jianying [1 ]
Zhou, Tao [1 ]
Song, Dan [1 ]
Tang, Yichuan [1 ]
Cui, Yanjie [1 ]
Wu, Bing [1 ]
机构：
[1] Natl Inst Metrol, Beijing 100029, Peoples R China
来源：
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 2020年 / 164卷
关键词：
Pulsed glow discharge mass spectrometry; Quantitative analysis; Purity analysis; High purity lanthanum oxide; Matrix effect; RELATIVE SENSITIVITY FACTORS; RARE-EARTH IMPURITIES; TRACE-ELEMENTS; DIRECT QUANTIFICATION; TIME; CRYSTAL; POWDER; SYSTEM; COPPER;
D O I：
10.1016/j.sab.2019.105748
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
[No abstract available]
引用
收藏
页数：9
相关论文
共 50 条
[1]  
[Anonymous], 1980, Glow Discharge Processes, DOI DOI 10.1063/1.2914660
[2]   Pulsed glow discharges for analytical applications [J].
Belenguer, Ph. ;
Ganciu, M. ;
Guillot, Ph. ;
Nelis, Th. .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2009, 64 (07) :623-641
[3]   Pulsed glow discharge enables direct mass spectrometric measurement of fluorine in crystal materials - Fluorine quantification and depth profiling in fluorine doped potassium titanyl phosphate [J].
Bodnar, Victoria ;
Ganeev, Alexander ;
Gubal, Anna ;
Solovyev, Nikolay ;
Glumov, Oleg ;
Yakobson, Viktor ;
Murin, Igor .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2018, 145 :20-28
[4]   RF-pulsed glow discharge time-of-flight mass spectrometry for glass analysis: Investigation of the ion source design [J].
Bouza, Marcos ;
Fernandez, Beatriz ;
Gonzalez-Gago, Cristina ;
Bordel, Nerea ;
Pereiro, Rosario ;
Sanz-Medel, Alfredo .
ANALYTICA CHIMICA ACTA, 2012, 756 :30-36
[5]   New μs-pulsed DC glow discharge assembly on a fast flow high power source for time resolved analysis in high resolution mass spectrometry [J].
Churchill, Glyn ;
Putyera, Karol ;
Weinstein, Viktoria ;
Wang, Xinwei ;
Steers, Edward B. M. .
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 2011, 26 (11) :2263-2273
[6]   NEW TECHNIQUE FOR ELEMENTAL ANALYSIS OF THIN SURFACE LAYERS OF SOLIDS [J].
COBURN, JW ;
KAY, E .
APPLIED PHYSICS LETTERS, 1971, 19 (09) :350-&
[7]   Comparison between the use of direct current glow discharge mass spectrometry and inductively coupled plasma quadrupole mass spectrometry for the analysis of trace elements in nuclear samples [J].
de las Heras, LA ;
Bocci, F ;
Betti, M ;
Actis-Dato, LO .
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 2000, 368 (01) :95-102
[8]   Detection limits for glow discharge mass spectrometry (GDMS) analyses of impurities in solar cell silicon [J].
Di Sabatino, Marisa .
MEASUREMENT, 2014, 50 :135-140
[9]   Determination of doping elements of synthetic crystals by direct current glow discharge mass spectrometry [J].
Dong, Jiangli ;
Qian, Rong ;
Xiong, Wei ;
Qu, Haiyun ;
Siqin, Bilige ;
Zhuo, Shangjun ;
Jin, Jun ;
Wen, Zhaoyin ;
He, Pingang ;
Robinson, Peter Kenneth .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 2014, 361 :1-8
[10]   Sputter crater formation in the case of microsecond pulsed glow discharge in a Grimm-type source. Comparison of direct current and radio frequency modes [J].
Efimova, Varvara ;
Hoffmann, Volker ;
Eckert, Juergen .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2012, 76 :181-189
12345