High-Aspect-Ratio Silicon Nanostructures on N-type Silicon Wafer Using Metal-Assisted Chemical Etching (MACE) Technique

被引:0
|
作者
Razak, Nurul Huda Abdul [1 ]
Amin, Nowshad [1 ]
Kiong, Tiong Sieh [2 ]
Sopian, Kamaruzzaman [3 ]
Akhtaruzzaman, Md [3 ]
机构
[1] Univ Kebangsaan Malaysia, Dept Elect Elect & Syst Engn, Bangi, Malaysia
[2] Univ Tenaga Nas, Inst Sustainable Energy ISE, Kajang, Selangor, Malaysia
[3] Univ Kebangsaan Malaysia, Solar Energy Res Inst SERI, Bangi, Malaysia
关键词
Metal-assisted chemical etching; high-aspect-ratio microstructure; silicon microstructure; solar cells and reflectance;
D O I
10.1109/PVSC43889.2021.9518597
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
In this paper, silicon nanowires formation on Ntype crystalline silicon wafer is studied. Metal-assisted chemical etching (MACE) technique is used in this study because it's low cost but can produce a high-aspect-ratio of silicon nanowires. High-aspect-ratio silicon nanostructures have been proved as an effective texture for light trapping on silicon solar cells surfaces. The photons from incident light can be trap on the silicon nanowires and then being absorb into the cells which resulting high efficiency silicon solar cells. Traditionally, MACE works by creating a holes using metal catalyst such as Ag or Au in order to reduce of the etchant. The hydrofluoric acid (HF) and hydrogen peroxide (H2O2) are function to etched the metal native oxide thus create a pores or nanowires formation. Roughness parameters of silicon nanowires was investigate in order to see the texture of silicon nanowires is rough enough to trap more photons on silicon wafer surfaces. Hence, roughness parameters are very important for texturing silicon wafer surfaces. In this study, root mean square (RMS) is used as an indicators for which acquired from the line profiles. Results from the roughness parameters shown a good compatibility.
引用
收藏
页码:2596 / 2599
页数:4
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