Detection of defects buried in metallic samples by scanning microwave microscopy

被引：77

作者：

Plassard, C. ^{[1
]}

Bourillot, E. ^{[1
]}

Rossignol, J. ^{[1
]}

Lacroute, Y. ^{[1
]}

Lepleux, E. ^{[2
]}

Pacheco, L. ^{[2
]}

Lesniewska, E. ^{[1
]}

机构：

[1] CNRS Univ Bourgogne, UMR CNRS 5209, Inst Carnot Bourgogne, F-21078 Dijon, France

[2] ScienTec, F-91952 Les Ulis, France

来源：

PHYSICAL REVIEW B | 2011年 / 83卷 / 12期

关键词：

TUNNELING MICROSCOPE; REFRACTIVE-INDEX; FIELD; SURFACE; ZONE; TIP;

D O I：

10.1103/PhysRevB.83.121409

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This paper reports the local detection of buried calibrated metal defects in metal samples by a new experimental technique, scanning microwave microscopy. This technique combines the electromagnetic measurement capabilities of a microwave vector network analyzer with the subnanometer-resolution capabilities of an atomic force microscope. The network analyzer authorizes the use of several frequencies in the range 1-6 GHz, allowing three-dimensional tomographical investigation, which is useful for the detection of bulk defects in metal materials.

引用

页数：4

共 20 条

[1]

Bekefi G., 1977, Electromagnetic Vibrations, Waves, and Radiation

[2]

BELEVITCH V, 1971, PHILIPS TECH REV, V32, P221

[3] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[4] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].

BINNING, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61

[5] DETERMINATION OF MODE-CUTOFF WAVELENGTHS AND REFRACTIVE-INDEX PROFILE OF PLANAR OPTICAL WAVE-GUIDES WITH A PHOTON SCANNING TUNNELING MICROSCOPE [J].

BOURILLOT, E ;

HOSAIN, SI ;

GOUDONNET, JP ;

VOIRIN, G ;

KOTROTSIOS, G .

PHYSICAL REVIEW B, 1995, 51 (16) :11225-11228

[6] ANALYSIS OF PHOTON-SCANNING TUNNELING MICROSCOPE IMAGES OF INHOMOGENEOUS SAMPLES - DETERMINATION OF THE LOCAL REFRACTIVE-INDEX OF CHANNEL WAVE-GUIDES [J].

BOURILLOT, E ;

DEFORNEL, F ;

GOUDONNET, JP ;

PERSEGOL, D ;

KEVORKIAN, A ;

DELACOURT, D .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1995, 12 (01) :95-106

[7] Resolution enhancing using cantilevered tip-on-aperture silicon probe in scanning near-field optical microscopy [J].

Chang, Won-Seok ;

Bauerdick, Sven ;

Jeong, Mun Seok .

ULTRAMICROSCOPY, 2008, 108 (10) :1070-1075

[8] Imaging the local density of states of optical corrals [J].

Chicanne, C ;

David, T ;

Quidant, R ;

Weeber, JC ;

Lacroute, Y ;

Bourillot, E ;

Dereux, A ;

des Francs, GC ;

Girard, C .

PHYSICAL REVIEW LETTERS, 2002, 88 (09) :4-974024

[9] THE INFLUENCE OF LATERAL FORCES IN SCANNING FORCE MICROSCOPY [J].

DENBOEF, AJ .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, 62 (01) :88-92

[10] Local detection of the optical magnetic field in the near zone of dielectric samples [J].

Devaux, E ;

Dereux, A ;

Bourillot, E ;

Weeber, JC ;

Lacroute, Y ;

Goudonnet, JP ;

Girard, C .

PHYSICAL REVIEW B, 2000, 62 (15) :10504-10514

← 1 2 →