Doping in 2D

被引:9
作者
不详
机构
关键词
2;
D O I
10.1038/s41928-021-00668-9
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ion implantation can be used to dope silicon devices, but can be problematic when applied to the atomically thin crystal structure of two-dimensional materials — an increasing range of alternative methods is though available.
引用
收藏
页码:699 / 699
页数:1
相关论文
共 2 条
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