GRT at the SBST 2015 Tool Competition

被引：9

作者：

Ma, Lei ^{[1
,5
]}

Artho, Cyrille ^{[2
]}

Zhang, Cheng ^{[3
]}

Sato, Hiroyuki ^{[1
]}

Hagiya, Masami ^{[1
]}

Tanabe, Yoshinori ^{[4
]}

Yamamoto, Mitsuharu ^{[5
]}

机构：

[1] Univ Tokyo, Tokyo 1138654, Japan

[2] AIST, RISEC, Ibaraki, Japan

[3] Univ Waterloo, Waterloo, ON N2L 3G1, Canada

[4] Natl Inst Informat, Koganei, Tokyo, Japan

[5] Chiba Univ, Chiba, Japan

来源：

2015 IEEE/ACM 8TH INTERNATIONAL WORKSHOP ON SEARCH-BASED SOFTWARE TESTING (SBST) | 2015年

关键词：

Software testing; automatic test case generation; program analysis; random testing;

D O I：

10.1109/SBST.2015.19

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

GRT (Guided Random Testing) is an automatic test generation tool for Java code, which leverages static and dynamic program analysis to guide run-time test generation. In this paper, we summarize competition results and experiences of GRT in participating in SBST 2015, where GRT ranked first with a score of 203.73 points over 63 Java classes from 10 packages of 9 open-source software projects.

引用

页码：48 / 51

页数：4

共 15 条

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