Automatic 3-D Measurement Method for Nonuniform Moving Objects

被引:21
作者
Duan, Minghui [1 ]
Jin, Yi [1 ]
Chen, Huaian [1 ]
Zheng, Jinjin [1 ]
Zhu, Changan [1 ]
Chen, Enhong [2 ]
机构
[1] Univ Sci & Technol China, Dept Precis Machinery & Precis Instruments, Hefei 230022, Anhui, Peoples R China
[2] Univ Sci & Technol China, Dept Comp Sci, Hefei 230022, Anhui, Peoples R China
基金
中国国家自然科学基金;
关键词
In situ 3-D shape measurements; phase-shifting profilometry (PSP); subpixel fringe image registration; surface misalignment and phase errors; PRECISION POSITION MEASUREMENT; PHASE-SHIFTING PROFILOMETRY; IMAGE REGISTRATION; FRINGE PROJECTION; SHAPE MEASUREMENT; ACCURACY; PERFORMANCE; EXTENSION; SELECTION;
D O I
10.1109/TIM.2021.3106119
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Phase-shifting profilometry (PSP) via sequential fringe projection is applicable for high-accuracy 3-D measurements of static objects. However, moving objects cannot be static or quasi-static during one projection cycle, thereby causing surface misalignment and phase errors in 3-D measurements. This article proposes a motion-estimated PSP based on the fringe-oriented synthetic phase correlation algorithm (FO-SPCA), which achieves automatic 3-D measurements of objects in nonuniform 2-D motion. To robustly estimate the motion of objects among fringe images, the proposed fringe-oriented feature extraction technique obtains the surface features by eliminating the modulation influence of sinusoidal illumination. Furthermore, the FO-SPCA is developed to accurately detect the subpixel displacements of moving objects according to object surface features. With the subpixel displacements, the alignment procedure is completed through a reverse 2-D transformation and then the phase errors are compensated accordingly. The simulation and experimental results verify the feasibility and robustness of the motion-estimated PSP for the in situ 3-D measurements of nonuniform moving objects.
引用
收藏
页数:11
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共 31 条
  • [1] Pixel-wise absolute phase unwrapping using geometric constraints of structured light system
    An, Yatong
    Hyun, Jae-Sang
    Zhang, Song
    [J]. OPTICS EXPRESS, 2016, 24 (16): : 18445 - 18459
  • [2] On the Comparison of Trilinear, Cubic Spline, and Fuzzy Interpolation Methods in the High-Accuracy Measurements
    Bai, Ying
    Wang, Dali
    [J]. IEEE TRANSACTIONS ON FUZZY SYSTEMS, 2010, 18 (05) : 1016 - 1022
  • [3] REFRACTIVE SURFACE FLOW VISUALIZATION USING IMAGE-PROCESSING
    BRITTON, DF
    SMITH, LM
    [J]. APPLIED OPTICS, 1995, 34 (11): : 1872 - 1877
  • [4] Inpainting for Fringe Projection Profilometry Based on Geometrically Guided Iterative Regularization
    Budianto
    Lun, Daniel P. K.
    [J]. IEEE TRANSACTIONS ON IMAGE PROCESSING, 2015, 24 (12) : 5531 - 5542
  • [5] Histograms of oriented gradients for human detection
    Dalal, N
    Triggs, B
    [J]. 2005 IEEE COMPUTER SOCIETY CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, VOL 1, PROCEEDINGS, 2005, : 886 - 893
  • [6] Phase-shifting profilometry for the robust 3-D shape measurement of moving objects
    Duan, Minghui
    Jin, Yi
    Xu, Chunmei
    Xu, Xiaobo
    Zhu, Changan
    Chen, Enhong
    [J]. OPTICS EXPRESS, 2019, 27 (16): : 22100 - 22115
  • [7] Damage methodology approach on a composite panel based on a combination of Fringe Projection and 2D Digital Image Correlation
    Felipe-Sese, Luis
    Diaz, Francisco A.
    [J]. MECHANICAL SYSTEMS AND SIGNAL PROCESSING, 2018, 101 : 467 - 479
  • [8] Robust dynamic 3-D measurements with motion-compensated phase-shifting profilometry
    Feng, Shijie
    Zuo, Chao
    Tao, Tianyang
    Hu, Yan
    Zhang, Minliang
    Chen, Qian
    Gu, Guohua
    [J]. OPTICS AND LASERS IN ENGINEERING, 2018, 103 : 127 - 138
  • [9] Extension of phase correlation to subpixel registration
    Foroosh, H
    Zerubia, JB
    Berthod, M
    [J]. IEEE TRANSACTIONS ON IMAGE PROCESSING, 2002, 11 (03) : 188 - 200
  • [10] Efficient subpixel image registration algorithms
    Guizar-Sicairos, Manuel
    Thurman, Samuel T.
    Fienup, James R.
    [J]. OPTICS LETTERS, 2008, 33 (02) : 156 - 158