Transmission X-ray microscopy with 50nm resolution in Ritsumeikan synchrotron radiation center

被引：0

作者：

Takemoto, K ^{[1
]}

Hirai, A ^{[1
]}

Niemann, B ^{[1
]}

Nishino, K ^{[1
]}

Hettwer, M ^{[1
]}

Rudolph, D ^{[1
]}

Anderson, E ^{[1
]}

Attwood, D ^{[1
]}

Kern, DP ^{[1
]}

Nakayama, Y ^{[1
]}

Kihara, H ^{[1
]}

机构：

[1] Kansai Med Univ, Phys Lab, Osaka, Japan

来源：

X-RAY MICROSCOPY, PROCEEDINGS | 2000年 / 507卷

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Transmission X-ray microscope at Rits SR Center at Ritsumeikan University has been upgraded to get a higher performance. Its optical configuration allows a continuous wavelength change throughout water window region, 2.2-4.3nm. The present paper describes results observed with the high-performance X-ray microscope, and compared the images taken at two different wavelengths, 2.4nm and 3.2nm. Its achieved resolution with each wavelength was below 50nm. Several specimens such as latex spheres of 0.23mum diameter, diatoms of 0.1mum inner structures could be clearly resolved.

引用

页码：446 / 451

页数：6

共 10 条

[1] ANDERSON EH, 1992, XRAY MICROSCOPY, V3, P75
[2] Imaging soft X-ray microscope at Rits Synchrotron Radiation Center
Hirai, A
Takemoto, K
Nishino, K
Watanabe, N
Anderson, E
Attwood, D
Kern, D
Hettwer, M
Rudolph, D
Aoki, S
Nakayama, Y
Kihara, H
[J]. JOURNAL OF SYNCHROTRON RADIATION, 1998, 5 : 1102 - 1104
[3] Transmission x-ray microscopy with 50 nm resolution installed at Ritsumeikan Synchrotron Radiation Center
Hirai, A
Takemoto, K
Nishino, K
Niemann, B
Hettwer, M
Rudolph, D
Anderson, E
Attwood, D
Kern, DP
Nakayama, Y
Kihara, H
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1999, 38 (1A): : 274 - 278
[4] HIRAI A, 1998, XRAY MICROSCOPY SPEC, P123
[5] Compact superconducting ring at Ritsumeikan University
Iwasaki, H
Nakayama, Y
Ozutsumi, K
Yamamoto, Y
Tokunaga, Y
Saisho, H
Matsubara, T
Ikeda, S
[J]. JOURNAL OF SYNCHROTRON RADIATION, 1998, 5 : 1162 - 1165
[6] Description of an x-ray microscope with 30 nm resolution
Medenwaldt, R
Uggerhoj, E
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (08) : 2974 - 2977
[7] Meyer-Ilse W., 1998, XRAY MICROSCOPY SPEC, P3, DOI 10.1007/978-3- 642-72106-9_1
[8] SCHMAHL G, 1993, OPTIK, V93, P95
[9] A ZONE-PLATE SOFT-X-RAY MICROSCOPE USING MONOCHROMATIZED UNDULATOR RADIATION AT THE BEAMLINE NE1B OF THE TRISTAN ACCUMULATION RING
WANG, JD
KAGOSHIMA, Y
MIYAHARA, T
ANDO, M
AOKI, S
ANDERSON, E
ATTWOOD, D
KERN, D
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (02) : 1401 - 1403
[10] WATANABE N, 1998, XRAY MICROSCOPY SPEC, P65

← 1 →