Calculating the trajectories of triboelectrically charged particles using Discrete Element Modeling (DEM)

被引：65

作者：

Hogue, Michael D. ^{[1
]}

Calle, Carlos I. ^{[1
]}

Weitzman, Peter S. ^{[2
]}

Curry, David R. ^{[2
]}

机构：

[1] NASA, Electrostat & Surface Phys Lab, Kennedy Space Ctr, Kennedy Space Ctr, FL 32899 USA

[2] DEM Solut USA Inc, Lebanon, NH 03766 USA

来源：

JOURNAL OF ELECTROSTATICS | 2008年 / 66卷 / 1-2期

关键词：

triboelectric; particles; Discrete Element Modeling; EDEM; screened electrostatic force; simulation;

D O I：

10.1016/j.elstat.2007.08.007

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Theoretical and experimental work has been performed pursuant to incorporating electrostatic forces into a commercial Discrete Element Modeling (DEM) software package. This DEM software is used to model the trajectories of large numbers of particles for industrial applications and processes. Electrostatic forces due to the triboelectrification of the particles will be included in the model in addition to existing kinematic forces enhancing the fidelity of the calculation. In this paper, we will present an overview of the theoretical calculations and experimental data and their comparison to the results of the DEM simulations. (c) 2007 Elsevier B.V. All rights reserved.

引用

页码：32 / 38

页数：7