Effect of Radiation on a Mach-Zehnder Interferometer Silicon Modulator for HL-LHC Data Transmission Applications

被引：41

作者：

El Nasr-Storey, Sarah Seif ^{[1
,2
]}

Boeuf, Frederic ^{[3
]}

Baudot, Charles ^{[3
]}

Detraz, Stephane ^{[1
]}

Fedeli, Jean Marc ^{[4
]}

Marris-Morini, Delphine ^{[5
]}

Olantera, Lauri ^{[1
]}

Pezzullo, Giuseppe ^{[1
]}

Sigaud, Christophe ^{[1
]}

Soos, Csaba ^{[1
]}

Troska, Jan ^{[1
]}

Vasey, Francois ^{[1
]}

Vivien, Laurent ^{[5
]}

Zeiler, Marcel ^{[1
]}

Ziebell, Melissa ^{[1
]}

机构：

[1] European Org Nucl Res CERN, CH-1211 Geneva, Switzerland

[2] Univ Bristol, Bristol BS8 1TH, Avon, England

[3] ST Microelect, F-75669 Paris, France

[4] CEA LET, F-38054 Grenoble 9, France

[5] Univ Paris 11, Inst Elect Fondamentale, F-91405 Orsay, France

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2015年 / 62卷 / 01期

关键词：

High-luminosity LHC (HL-LHC); optoelectronics; radiation damage; silicon photonics; total ionizing dose (TID);

D O I：

10.1109/TNS.2015.2388546

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

High-speed Mach-Zehnder interferometer silicon modulators were irradiated with neutrons and X-rays in two separate radiation tests. The devices were exposed to a total fluence of 1.2 x 10(15) neutrons/cm(2) and a total ionizing dose of 1.3 MGy; levels comparable to the worst radiation levels for a tracking detector after 10 years of operation at the High-Luminosity LHC. Our measurements indicate that the devices' performance does not significantly degrade after exposure to nonionizing radiation and begins to be affected by ionizing radiation after a dose of a few hundred kGy; the phase-shift for an applied reverse bias of 1 V is 10% of its preirradiated value after 600 kGy of received ionizing dose.

引用

页码：329 / 335

页数：7

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