Nanometer undulations on CaF2 cleaved surfaces observed by atomic force microscopy

被引：3
|
作者：
Coupeau, C
Small, MK
Junqua, N
Grilhe, J
机构：
[1] Lab. de Metall. Phys.-URA CNRS 131, Univ. de Poitiers-Fac. des Sciences, Bat. S.P.2.M.I, 86960 Futuroscope Cedex, Bd 3
来源：
SCRIPTA MATERIALIA | 1996年 / 34卷 / 11期
关键词：
D O I：
10.1016/1359-6462(96)00058-9
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
[No abstract available]
引用
收藏
页码：1673 / 1678
页数：6
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