Experimental investigation of the instability of buckling patterns:: From straight-sided to wormlike structures

被引：40
作者：
Cleymand, F [1 ]
Coupeau, C [1 ]
Grilhé, J [1 ]
机构：
[1] SP2MI, Met Phys Lab, UMR 6630, F-86962 Futuroscope, France
来源：
SCRIPTA MATERIALIA | 2001年 / 44卷 / 11期
关键词：
atomic force microscopy (AFM); thin films; wrinkling;
D O I：
10.1016/S1359-6462(01)00969-1
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The aging of 304L stainless steel thin films deposited on polycarbonate substrates was investigated by atomic force microscopy. The destabilization from pre-existing straight-sided blisters to a worm-like delamination pattern was observed and was associated with a lateral growth of the initial straight-sided blister. The waving of buckling patterns can be explained by an optimal release of the stress in the tranversal direction.
引用
收藏
页码：2623 / 2627
页数：5
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