Bulk-silicon power integrated circuit technology for 192-channel data driver ICs of plasma display panel

被引:0
作者
Sun, W. [1 ]
Li, H. [1 ]
Yi, Y. [1 ]
Wu, H. [1 ]
Shi, L. [1 ]
机构
[1] Southeast Univ, Natl ASIC Syst Engn Res Ctr, Jiangsu, Peoples R China
关键词
Integrated circuits;
D O I
10.1049/iet-cds:20070279
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A 192-channel data driver IC for plasma display panel has been proposed using bulk-silicon CDMOS (CMOS and DMOS) technology. A novel latch-up protection structure and a novel high-voltage pLDMOS are used in the data driver IC, so as to avoid the latch-up during the system application and to reduce the process cost by more than 10% compared with the conventional one. The power consumption of the presented data driver IC with a novel level-shift circuit was reduced by >20% compared with the conventional one. The rise and the fall times of the output stage are similar to 80 and 104 ns, respectively.
引用
收藏
页码:277 / 280
页数:4
相关论文
共 11 条
  • [1] CASTELLANOM JA, 2000, MARKET TRENDS DISPLA, P407
  • [2] HUMPHREY GH, 2003, Patent No. 65869674
  • [3] High-voltage power integrated circuit technology using SOI for driving plasma display panels
    Kim, J
    Roh, TM
    Kim, SG
    Song, QS
    Lee, DW
    Koo, JG
    Cho, KI
    Ma, DS
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2001, 48 (06) : 1256 - 1263
  • [4] High voltage SOI CMOS IC technology for driving plasma display panels
    Kobayashi, K
    Yanagigawa, H
    Mori, K
    Yamanaka, S
    Fujiwara, A
    [J]. ISPSD '98 - PROCEEDINGS OF THE 10TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & ICS, 1998, : 141 - 144
  • [5] LEE BH, 2003, 30 INT C PLASM SCI I, P120
  • [6] LUDIKHUIZE AW, 1994, ISPSD '94 - PROCEEDINGS OF THE 6TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & ICS, P249, DOI 10.1109/ISPSD.1994.583734
  • [7] NUNOMURA K, 1997, P 4 INT DISPL WORKSH, P499
  • [8] High voltage output circuit using n- and n-LDMOSFET with thick gate oxide for PDP driver IC
    Song, QS
    Song, SS
    [J]. ELECTRONICS LETTERS, 2004, 40 (16) : 989 - 990
  • [9] SUMIDA H, 2000, Patent No. 6057726
  • [10] Improving the yield and reliability of the bulk-silicon HV-CMOS by adding a P-well
    Sun, WF
    Shi, LX
    [J]. MICROELECTRONICS RELIABILITY, 2005, 45 (01) : 185 - 190