Enhanced optoelectronics performances of multilayer Sb0.1Mo0.9Se2/SnSe2 heterostructure

被引:2
作者
Dixit, Vijay [1 ]
Nair, Salil [1 ]
Joy, Jolly [1 ]
Vyas, C. U. [1 ,2 ]
Narayan, Som [3 ]
Jha, P. K. [3 ]
Solanki, G. K. [1 ]
Pathak, V. M. [1 ]
机构
[1] Sardar Patel Univ, Dept Phys, Anand 388120, Gujarat, India
[2] Shri AN Patel PG Inst Sci & Res, Anand 388001, Gujarat, India
[3] Maharaja Sayajirao Univ Baroda, Dept Phys, Vadodara 390002, Gujarat, India
基金
英国科研创新办公室;
关键词
V CHARACTERISTICS; SINGLE-CRYSTALS; I-V; GROWTH; PHOTODETECTION;
D O I
10.1007/s10854-021-07256-9
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In the present investigation, Sb0.1Mo0.9Se2 single crystals belonging to semiconductor-layered transition metal di-chalcogenides (SLTMDCs) are grown by direct vapor transport (DVT) technique in a dual-zone furnace. The surface topographic properties of exfoliated crystals are studied under an optical microscope and scanning electron microscopy (SEM). The SEM analysis reveals the presence of hexagonal particles. The direct optical energy band gap of exfoliated crystal, 1.44 eV, is obtained by UV-visible spectroscopy. The photoluminescence (PL) and Raman spectroscopy are employed to elucidate the excitonic mechanism and vibrational properties. The semiconducting behavior of exfoliated crystals is examined by high-temperature resistivity. Heterostructure devices of thin-film SnSe2/Sb0.1Mo0.9Se2 crystal are prepared to study its rectifying nature. The diode parameter such as ideality factor, saturation current, and barrier potential is evaluated by Ln I-V technique. The photoconduction property of the fabricated device along the ab-plane is recorded under a polychromatic source of intensity 30 mW cm(-2). The photo-detecting properties such as responsivity (149 mA W-1) and detectivity (10(8) Jones) are determined to evince the excellent photodetection property of detector at 800 mV and 1200 mV bias voltages, respectively.
引用
收藏
页码:28739 / 28749
页数:11
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