Frequency stability and phase noise of an improved X-band cryocooled sapphire oscillator

被引：1
|
作者：
Nand, Nitin R. [1 ]
Hartnett, John G. [1 ]
机构：
[1] Univ Western Australia, Sch Phys, Crawley, WA 6009, Australia
来源：
2010 IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM (FCS) | 2010年
关键词：
PULSE-TUBE CRYOCOOLER;
D O I：
10.1109/FREQ.2010.5556243
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A previously implemented cryogenic sapphire oscillator (CSO) based on a commercial cryocooler has been modified and its frequency stability and phase noise re-measured against a nominally similar liquid helium cooled CSO in the same laboratory. Assuming both contribute equally, their frequency stability and phase noise have been evaluated. We report for the oscillator a minimum Allan deviation of 3.9 x 10(-16) at 20 s, a long-term frequency drift less than 1 x 10(-14)/day, and a measured single sideband phase noise of -97 dBc/Hz at 1 Hz offset from the carrier. The stated performance of the cryocooled CSO is adequate for it to be deployed at a local VLBI site for comparison against the hydrogen maser which is the current reference standard.
引用
收藏
页码：670 / 673
页数：4
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