He-vacancy interaction and multiple He trapping in small void of silicon carbide

被引:30
作者
Li, Ruihuan [1 ,2 ]
Li, Wenbo [3 ]
Zhang, Chong [2 ]
Zhang, Pengbo [4 ]
Fan, Hongyu [5 ]
Liu, Dongping [5 ]
Vitos, Levente [1 ]
Zhao, Jijun [2 ]
机构
[1] Royal Inst Technol, Dept Mat Sci & Engn, SE-10044 Stockholm, Sweden
[2] Dalian Univ Technol, Key Lab Mat Modificat Laser Ion & Electron Beams, Minist Educ, Dalian 116024, Peoples R China
[3] Dalian Univ Technol, Fac Elect Informat & Elect Engn, Sch Elect Sci & Technol, Dalian 116024, Peoples R China
[4] Dalian Maritime Univ, Dept Phys, Dalian 116026, Peoples R China
[5] Dalian Natl Univ, Sch Phys & Mat Engn, Dalian 116600, Peoples R China
基金
瑞典研究理事会; 中国国家自然科学基金;
关键词
SICF/SIC COMPOSITES; SIC/SIC COMPOSITES; FUSION POWER; HELIUM; 1ST-PRINCIPLES; IRRADIATION; BEHAVIOR; ISSUES; CHALLENGE; STABILITY;
D O I
10.1016/j.jnucmat.2014.10.062
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In fusion environment, large amounts of helium (He) atoms are produced by transmutation along with structural damage in the structural materials, causing material swelling and degrading of physical properties. To understand the microscopic mechanism of He trapping in vacancies and voids, we explored He-vacancy interactions in He(n)Va(m) (Va for vacancy) clusters (n, m = 1-4) and multiple He trapping in a 7atom void of silicon carbide (SiC) by first-principles calculations. The binding energy between He and the HenVam clusters increases with the number of vacancies, while the vacancy binding energy gradually increases with the number of He atoms. Furthermore, a small cavity of about 0.55 nm in diameter can accommodate up to 14 He atoms energetically and the corresponding internal pressure is estimated to be 2.5 GPa. The tendency of He trapping in small voids provides an explanation for the experimentally observed He bubble formation at vacancy defects in SiC materials. (C) 2014 Elsevier B. V. All rights reserved.
引用
收藏
页码:36 / 41
页数:6
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