Demodulation based testing of off-chip driver performance

被引：0

作者：

Daehn, W ^{[1
]}

机构：

[1] Hsch Magdeburg Stendahl, Magdeburg, Germany

来源：

ETW 2001: IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS | 2001年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper presents a new technique for testing the performance of offchip drivers (OCDs). It is based on the use of periodic signals and a demodulation based analysis in the frequency domain The technique is particular useful for replacing expensive time domain tests of OCD performance by simpler and less expensive phase shift measurements in the frequency domain. Such tests can easily be performed by low cost external test circuitry or low cost ATE.

引用

页码：42 / 47

页数：6