Stable atomic imaging of Si(111)-7 x 7 surface by scanning tunneling microscope with carbon nanotube tip

被引:43
作者
Shimizu, T
Tokumoto, H
Akita, S
Nakayama, Y
机构
[1] Natl Inst Adv Interdisciplinary Res, Joint Res Ctr Atom Technol, Tsukuba, Ibaraki 3058562, Japan
[2] Univ Osaka Prefecture, Dept Phys & Elect, Sakai, Osaka 5998531, Japan
关键词
carbon; scanning tunneling microscopy; silicon;
D O I
10.1016/S0039-6028(01)01119-0
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We demonstrated the usefulness of multi-walled carbon nanotube (CNT) as a probe tip of scanning tunneling microscope (STM) for imaging atoms on chemically active surfaces in an ultra-high vacuum (UHV) environment. When a clean Si(1 1 1)-7 x 7 surface was scanned with an as-prepared CNT tip, the atomic nature was recognized in a very first STM image, but after a few scans, it was quickly degraded by adsorbates (most probably oxygen molecules in the present case) coming out of the CNT tip. When the tip was once annealed thermally in UHV, the clear atomic nature was observed in STM images for a long period of time without any image degradation even if the tip touched the sample surface. Stable atomic STM imaging with the CNT tip in UHV will make the scanning prope microscope more reliable than before for the future application. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:L455 / L460
页数:6
相关论文
共 23 条
[1]   Influence of stiffness of carbon-nanotube probes in atomic force microscopy [J].
Akita, S ;
Nishijima, H ;
Nakayama, Y .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2000, 33 (21) :2673-2677
[2]   Growth and fabrication with single-walled carbon nanotube probe microscopy tips [J].
Cheung, CL ;
Hafner, JH ;
Odom, TW ;
Kim, K ;
Lieber, CM .
APPLIED PHYSICS LETTERS, 2000, 76 (21) :3136-3138
[3]   Atomic force microscopy of single-walled carbon nanotubes using carbon nanotube tip [J].
Choi, N ;
Uchihashi, T ;
Nishijima, H ;
Ishida, T ;
Mizutani, W ;
Akita, S ;
Nakayama, Y ;
Ishikawa, M ;
Tokumoto, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (6B) :3707-3710
[4]   Nanotubes as nanoprobes in scanning probe microscopy [J].
Dai, HJ ;
Hafner, JH ;
Rinzler, AG ;
Colbert, DT ;
Smalley, RE .
NATURE, 1996, 384 (6605) :147-150
[5]   Exploiting the properties of carbon nanotubes for nanolithography [J].
Dai, HJ ;
Franklin, N ;
Han, J .
APPLIED PHYSICS LETTERS, 1998, 73 (11) :1508-1510
[6]   Field emission microscopy of carbon nanotube caps [J].
Dean, KA ;
Chalamala, BR .
JOURNAL OF APPLIED PHYSICS, 1999, 85 (07) :3832-3836
[7]   Experimental and theoretical results of room-temperature single-electron transistor formed by the atomic force microscope nano-oxidation process [J].
Gotoh, Y ;
Matsumoto, K ;
Maeda, T ;
Cooper, EB ;
Manalis, SR ;
Fang, H ;
Minne, SC ;
Hunt, T ;
Dai, H ;
Harris, J ;
Quate, CF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2000, 18 (04) :1321-1325
[8]   Growth of nanotubes for probe microscopy tips [J].
Hafner, JH ;
Cheung, CL ;
Lieber, CM .
NATURE, 1999, 398 (6730) :761-762
[9]   HELICAL MICROTUBULES OF GRAPHITIC CARBON [J].
IIJIMA, S .
NATURE, 1991, 354 (6348) :56-58
[10]   Hydrogen storage in single-walled carbon nanotubes at room temperature [J].
Liu, C ;
Fan, YY ;
Liu, M ;
Cong, HT ;
Cheng, HM ;
Dresselhaus, MS .
SCIENCE, 1999, 286 (5442) :1127-1129