Structure, Dielectric relaxation And Magnetic Properties of Bi0.8Sr0.2Fe1-xTixO3 Multiferroic

被引：1

作者：

Reetu ^{[1
]}

Agarwal, A. ^{[1
]}

Sanghi, S. ^{[1
]}

Ashima ^{[1
]}

机构：

[1] Guru Jambheshwar Univ Sci & Technol, Dept Appl Phys, Hisar 125001, Haryana, India

来源：

INTERNATIONAL CONFERENCE ON ADVANCES IN CONDENSED AND NANO MATERIALS (ICACNM-2011) | 2011年 / 1393卷

关键词：

Multiferroic; X-ray diffraction; Dielectric constant; loss tangent; Magnetic hysteresis;

D O I：

10.1063/1.3653646

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Polycrystalline Bi(0.8)Sr(0.2)Fe(1-x)TixO(3) (x = 0.0, 0.2) multiferroics were synthesized by conventional solid state reaction method. Structure, dielectric relaxation and magnetic properties of as prepared samples were investigated. The crystal structure examined by XRD and Rietveld analysis confirmed the single phase rhombohedral (space group R-3 c no. 161) structure accompanied by tiny residual Bi2O3 phase. Dielectric response of these multiferroics was analyzed in the frequency range 10Hz - 5MHz at different temperatures. Both the samples showed dispersion in dielectric constant and dielectric loss factor (tan delta) values. Reduction in both loss tangent and dielectric ordering was observed on incorporation of Ti. Magnetic measurements were carried out at room temperature up to a field of 20kG. Magnetic hysteresis loops revealed significant increase in magnetization with Ti substitution.

引用

页数：2

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