Applications of optical coherence in interferometric metrology

被引:2
|
作者
de Groot, Peter J. [1 ]
机构
[1] Zygo Corp, Laurel Brook Rd, Middlefield, CT 06455 USA
来源
SPECKLE 2018: VII INTERNATIONAL CONFERENCE ON SPECKLE METROLOGY | 2018年 / 10834卷
关键词
Interferometry; speckle; coherence; metrology;
D O I
10.1117/12.2319106
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Limited light source coherence can be both a complication and a benefit to interferometric optical metrology. Although high-coherence lasers are great for displacement measuring interferometry, holography and Fizeau interferometry, many instruments rely on low coherence as part of the measurement principle. Examples include systems that separate parallel surfaces of transparent parts, coherence scanning interferometers for surface topography, and coupled-cavity fiber position sensors. In cases where high coherence is essential, there can nonetheless be a benefit to synthesizing reduced coherence to suppressing spurious fringes, coherent noise, and unwanted speckle.
引用
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页数:5
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