Shot noise measurement methods in electronic devices

被引：1

作者：

Chen Wen-Hao ^{[1
]}

Du Lei ^{[1
]}

Zhuang Yi-Qi ^{[2
]}

Bao Jun-Lin ^{[2
]}

He Liang ^{[1
]}

Chen Hua ^{[1
]}

Sun Peng ^{[1
]}

Wang Ting-Lan ^{[1
]}

机构：

[1] Xidian Univ, Sch Technol Phys, Xian 710071, Peoples R China

[2] Xidian Univ, Sch Microelect, Xian 710071, Peoples R China

来源：

ACTA PHYSICA SINICA | 2011年 / 60卷 / 05期

关键词：

shot noise; electronic devices; noise measurement; SUPPRESSION;

D O I：

10.7498/aps.60.050704

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The limitations to shot noise measurement methods based on superconducting quantum interference device (SQUID) and superconductivity-insulation-superconductor (SIS) Josephson junction are pointed out, and a method to measure the shot noises of conventional electronic devices is proposed. Shot noise characteristics of conventional electronic devices are analyzed, and then a low-temperature measurement system is established. By using a double-shielding construction and low noise preamplifier, the test system can achieve a good electromagnetic interference shielding and low background noise. The theoretical and the experimental results of shot noises in diodes at 10 K are in good agreement with each other. The accuracy and the credibility of measurement system are proved.

引用

页数：8

共 30 条

[21] Diffusion current and its effect on noise in submicron MOSFETs [J].

Obrecht, MS ;

Abou-Allam, E ;

Manku, T .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 2002, 49 (03) :524-526

[22] Shot-noise detection in a carbon nanotube quantum dot [J].

Onac, E ;

Balestro, F ;

Trauzettel, B ;

Lodewijk, CFJ ;

Kouwenhoven, LP .

PHYSICAL REVIEW LETTERS, 2006, 96 (02)

[23] Noise characteristics and, reliability of light emitting diodes based on nitrides [J].

Pralgauskaite, S. ;

Palenskis, V. ;

Matukas, J. ;

Petrulis, J. ;

Kurilcik, G. .

NOISE AND FLUCTUATIONS IN CIRCUITS, DEVICES, AND MATERIALS, 2007, 6600

[24] Noise characteristic and quality investigation of ultrafast avalanche photodiodes [J].

Pralgauskaite, S. ;

Palenskis, V. ;

Matukas, J. ;

Vizbaras, A. .

NOISE AND FLUCTUATIONS IN CIRCUITS, DEVICES, AND MATERIALS, 2007, 6600

[25]

Schottky W, 1918, ANN PHYS-BERLIN, V57, P541

[26] Shot noise in ballistic quantum dots with a mixed classical phase space [J].

Sim, HS ;

Schomerus, H .

PHYSICAL REVIEW LETTERS, 2002, 89 (06)

[27] Observation of hot-electron shot noise in a metallic resistor [J].

Steinbach, AH ;

Martinis, JM ;

Devoret, MH .

PHYSICAL REVIEW LETTERS, 1996, 76 (20) :3806-3809

[28]

Vandamme L, 2005, ADV EXPT METHODS NOI, P189

[29]

Yan C, 2008, SIL MON INT CIRC RF, P118

[30] Luttinger parameter of carbon nanotubes investigated by shot noise experiment [J].

Zhang, ZY ;

Wang, TH .

ACTA PHYSICA SINICA, 2004, 53 (03) :942-946

← 1 2 3 →