Shot noise measurement methods in electronic devices

被引：1

作者：

Chen Wen-Hao ^{[1
]}

Du Lei ^{[1
]}

Zhuang Yi-Qi ^{[2
]}

Bao Jun-Lin ^{[2
]}

He Liang ^{[1
]}

Chen Hua ^{[1
]}

Sun Peng ^{[1
]}

Wang Ting-Lan ^{[1
]}

机构：

[1] Xidian Univ, Sch Technol Phys, Xian 710071, Peoples R China

[2] Xidian Univ, Sch Microelect, Xian 710071, Peoples R China

来源：

ACTA PHYSICA SINICA | 2011年 / 60卷 / 05期

关键词：

shot noise; electronic devices; noise measurement; SUPPRESSION;

D O I：

10.7498/aps.60.050704

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The limitations to shot noise measurement methods based on superconducting quantum interference device (SQUID) and superconductivity-insulation-superconductor (SIS) Josephson junction are pointed out, and a method to measure the shot noises of conventional electronic devices is proposed. Shot noise characteristics of conventional electronic devices are analyzed, and then a low-temperature measurement system is established. By using a double-shielding construction and low noise preamplifier, the test system can achieve a good electromagnetic interference shielding and low background noise. The theoretical and the experimental results of shot noises in diodes at 10 K are in good agreement with each other. The accuracy and the credibility of measurement system are proved.

引用

页数：8

共 30 条

[21] Diffusion current and its effect on noise in submicron MOSFETs
Obrecht, MS
Abou-Allam, E
Manku, T
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2002, 49 (03) : 524 - 526
[22] Shot-noise detection in a carbon nanotube quantum dot
Onac, E
Balestro, F
Trauzettel, B
Lodewijk, CFJ
Kouwenhoven, LP
[J]. PHYSICAL REVIEW LETTERS, 2006, 96 (02)
[23] Noise characteristics and, reliability of light emitting diodes based on nitrides
Pralgauskaite, S.
Palenskis, V.
Matukas, J.
Petrulis, J.
Kurilcik, G.
[J]. NOISE AND FLUCTUATIONS IN CIRCUITS, DEVICES, AND MATERIALS, 2007, 6600
[24] Noise characteristic and quality investigation of ultrafast avalanche photodiodes
Pralgauskaite, S.
Palenskis, V.
Matukas, J.
Vizbaras, A.
[J]. NOISE AND FLUCTUATIONS IN CIRCUITS, DEVICES, AND MATERIALS, 2007, 6600
[25] Schottky W, 1918, ANN PHYS-BERLIN, V57, P541
[26] Shot noise in ballistic quantum dots with a mixed classical phase space
Sim, HS
Schomerus, H
[J]. PHYSICAL REVIEW LETTERS, 2002, 89 (06)
[27] Observation of hot-electron shot noise in a metallic resistor
Steinbach, AH
Martinis, JM
Devoret, MH
[J]. PHYSICAL REVIEW LETTERS, 1996, 76 (20) : 3806 - 3809
[28] Vandamme L, 2005, ADV EXPT METHODS NOI, P189
[29] Yan C, 2008, SIL MON INT CIRC RF, P118
[30] Luttinger parameter of carbon nanotubes investigated by shot noise experiment
Zhang, ZY
Wang, TH
[J]. ACTA PHYSICA SINICA, 2004, 53 (03) : 942 - 946

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