Shot noise measurement methods in electronic devices

被引：1

作者：

Chen Wen-Hao ^{[1
]}

Du Lei ^{[1
]}

Zhuang Yi-Qi ^{[2
]}

Bao Jun-Lin ^{[2
]}

He Liang ^{[1
]}

Chen Hua ^{[1
]}

Sun Peng ^{[1
]}

Wang Ting-Lan ^{[1
]}

机构：

[1] Xidian Univ, Sch Technol Phys, Xian 710071, Peoples R China

[2] Xidian Univ, Sch Microelect, Xian 710071, Peoples R China

来源：

ACTA PHYSICA SINICA | 2011年 / 60卷 / 05期

关键词：

shot noise; electronic devices; noise measurement; SUPPRESSION;

D O I：

10.7498/aps.60.050704

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The limitations to shot noise measurement methods based on superconducting quantum interference device (SQUID) and superconductivity-insulation-superconductor (SIS) Josephson junction are pointed out, and a method to measure the shot noises of conventional electronic devices is proposed. Shot noise characteristics of conventional electronic devices are analyzed, and then a low-temperature measurement system is established. By using a double-shielding construction and low noise preamplifier, the test system can achieve a good electromagnetic interference shielding and low background noise. The theoretical and the experimental results of shot noises in diodes at 10 K are in good agreement with each other. The accuracy and the credibility of measurement system are proved.

引用

页数：8

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