Two organic diselenides: Dimesityl diselenide and bis(2,4,6-triisopropylphenyl) diselenide

被引：12

作者：

Jeske, J ^{[1
]}

Salzen, AM ^{[1
]}

du Mont, WW ^{[1
]}

Jones, PG ^{[1
]}

机构：

[1] Tech Univ Braunschweig, Inst Anorgan & Analyt Chem, D-38023 Braunschweig, Germany

来源：

ACTA CRYSTALLOGRAPHICA SECTION C-CRYSTAL STRUCTURE COMMUNICATIONS | 1998年 / 54卷

关键词：

D O I：

10.1107/S0108270198010579

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The organic diselenides dimesityl diselenide [C18H22Se2, (I)] and bis(2,4,6-triisopropylphenyl) diselenide [C30H46Se2, (II)] display normal diselenide geometries: Se-Se bond lengths are 2.3341(6) in (I) and 2.3389(6)Angstrom in (II), and the absolute C-Se-Se-C torsion angles are 83.96 (12) in (I) and 73.38(16)degrees in (II).

引用

页码：1873 / 1875

页数：3

共 11 条

[1]

Allen F.H., 1993, CHEM AUTOMAT NEWS, V8, P31

[2] SYNTHESIS AND CHARACTERIZATION OF THE NEW SELENOLATE LIGAND -SEC6H3-2,6-MES(2) (MES=C6H2-2,4,6-ME(3)) AND ITS 2-COORDINATE-ZINC AND MANGANESE DERIVATIVES - FACTORS AFFECTING BENDING IN 2-COORDINATE METAL-COMPLEXES WITH ARYL-SUBSTITUTED LIGANDS [J].

ELLISON, JJ ;

RUHLANDTSENGE, K ;

HOPE, HH ;

POWER, PP .

INORGANIC CHEMISTRY, 1995, 34 (01) :49-54

[3] Coordination chemistry of 2,2'-dipyridyl diselenide: X-ray crystal structures of PySeSePy, [Zn(PySeSePy)Cl-2], [(PySeSePy)Hg(C6F5)(2)], [Mo(SePy)(2)(CO)(3)], [W(SePy)(2)(CO)(3)], and [Fe(SePy)(2)(CO)(2)] (PySeSePy=C5H4NSeSeC5H4N; SePy=[C5H4N(2-Se)-N,Se]) [J].

Kienitz, CO ;

Thone, C ;

Jones, PG .

INORGANIC CHEMISTRY, 1996, 35 (13) :3990-3997

[4]

MONT WW, 1990, INORG CHEM, V29, P4847

[5]

NICOLET, 1987, XDISK ANAL XRAY INST

[6]

NICOLET, 1987, P3 SOFTWARE

[7] PROPERTIES OF CHALCOGEN CHALCOGEN BONDS .17. DISULFANE AND TRISULFANE WITH STERICALLY CONGESTED ALKYL SUBSTITUENTS - THE 1ST TRANS-DIALKYLDISULFANE [J].

OSTROWSKI, M ;

JESKE, J ;

JONES, PG ;

DUMONT, WW .

CHEMISCHE BERICHTE-RECUEIL, 1993, 126 (06) :1355-1359

[8] PHASE ANNEALING IN SHELX-90 - DIRECT METHODS FOR LARGER STRUCTURES [J].

SHELDRICK, GM .

ACTA CRYSTALLOGRAPHICA SECTION A, 1990, 46 :467-473

[9]

SHELDRICK GM, 1993, SHELXL93 PROGRAM REF

[10]

SIEMENS, 1994, XEMP EMPIRICAL ABSOR

← 1 2 →