Development of a certified reference material (CRM) for seven trace elements (Al, Ca, Fe, K, Mg, Na and Ti) in high purity quartz

被引:10
|
作者
Prasad, A. Durga [1 ]
Thangavel, S. [1 ]
Rastogi, Lori [1 ]
Soni, D. [3 ]
Dash, K. [1 ,2 ]
Kumar, Sunil Jai [1 ]
机构
[1] Bhabha Atom Res Ctr, Natl Ctr Composit Characterisat Mat, Hyderabad 500062, India
[2] Homi Bhabha Natl Inst, Mumbai 400094, Maharashtra, India
[3] CSIR Natl Phys Lab, New Delhi 110012, India
关键词
Certified reference material; Trace elements; High purity quartz; Measurement uncertainty; Inter-laboratory comparison exercise (ILCE); ICP-AES; UNS-SPS; ICP-AES; IMPURITIES; SAND;
D O I
10.1016/j.microc.2021.106926
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Certified reference material (CRM) for trace elements in quartz matrix is required to assess the performance of analytical methods in regards to their validation, calibration and for comparability of measurements between laboratories. Due to unavailability of matrix matched CRMs in our country, National Centre for Compositional Characterization of Materials (NCCCM) of Bhabha Atomic Research Centre (BARC), Hyderabad and Council of Scientific and Industrial Research CSIR-National Physical Laboratory (NPL), New Delhi have initiated a program for the production of a CRM for the certification of critical trace elements in high purity quartz. Preparation and certification of Indian Reference Material (BND 4101.01), quartz powder with certified mass fractions of seven trace impurities was carried out jointly between NCCCM and NPL; two national laboratories of Government of India. Sampling constant (Ks) were established before carrying out the homogeneity test within and between bottles. The homogeneity test was carried out by NCCCM. The certified values were assigned after Inter Labo-ratory Comparison Exercise (ILCE) between reputed National Laboratories in India as per ISO-Guide 34 & 35. Analytical techniques like Inductively coupled plasma atomic emission spectrometry (ICP-AES), Flame atomic absorption spectrometry (FAAS) and Total reflection x-ray fluorescence analysis (TXRF) have been used for the characterization of property values.
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页数:8
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