Electron spectroscopy study of the Cu/SrTiO3(100) interface

被引:16
作者
Conard, T
Rousseau, AC
Yu, LM
Ghijsen, J
Sporken, R
Caudano, R
Johnson, RL
机构
[1] FAC UNIV NOTRE DAME PAIX,LAB INTERDISCIPLINAIRE SPECT ELECT,B-5000 NAMUR,BELGIUM
[2] UNIV HAMBURG,INST EXPTL PHYS 2,D-27761 HAMBURG,GERMANY
关键词
clusters; copper; electron energy loss spectroscopy; growth; low index single crystal surfaces; metallic films; metal-insulator interfaces; strontium titanate; X-ray photoelectron spectroscopy;
D O I
10.1016/0039-6028(96)00344-5
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Interface formation of copper on both reduced and stoichiometric SrTiO3(100) was investigated using photoemission (XPS, UPS), electron diffraction (LEED) and electron energy loss spectroscopy (HREELS). The growth mode of Cu on both surfaces involves the formation of a 2D-like layer and islands, but the thickness of the 2D-like layer and the number of islands is higher on the reduced substrate due to the higher number of defects. An analysis of the Auger parameter of Cu during growth demonstrates the strong interaction of Cu with SrTiO3. HREELS experiments showed a strong influence of the impact scattering interaction from the changes in the spectra with coverage, and the importance of the two different terminations of the (100) surface.
引用
收藏
页码:82 / 92
页数:11
相关论文
共 36 条
[21]   SURFACE DEFECTS AND ELECTRONIC-STRUCTURE OF SRTIO3 SURFACES [J].
HENRICH, VE ;
DRESSELHAUS, G ;
ZEIGER, HJ .
PHYSICAL REVIEW B, 1978, 17 (12) :4908-4921
[22]   STRUCTURE AND ELECTRONIC STATE OF THE TIO2 AND SRO TERMINATED SRTIO3(100) SURFACES [J].
HIKITA, T ;
HANADA, T ;
KUDO, M ;
KAWAI, M .
SURFACE SCIENCE, 1993, 287 (pt A) :377-381
[23]   Y, BA, CU, AND TI INTERFACE REACTIONS WITH SRTIO3 (100) SURFACES [J].
HILL, DM ;
MEYER, HM ;
WEAVER, JH .
JOURNAL OF APPLIED PHYSICS, 1989, 65 (12) :4943-4950
[24]   INFRARED-ABSORPTION STUDIES ON BARIUM TITANATE AND RELATED MATERIALS [J].
LAST, JT .
PHYSICAL REVIEW, 1957, 105 (06) :1740-1750
[25]   CHARACTERIZATION OF INSULATORS BY HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY - APPLICATION OF A SURFACE-POTENTIAL STABILIZATION TECHNIQUE [J].
LIEHR, M ;
THIRY, PA ;
PIREAUX, JJ ;
CAUDANO, R .
PHYSICAL REVIEW B, 1986, 33 (08) :5682-5697
[26]  
LUTH H, 1993, SURFACES INTERFACES, P102
[27]  
MOLLER PJ, 1991, THIN SOLID FILMS, V201, P267, DOI 10.1016/0040-6090(91)90116-F
[28]   SURFACE GEOMETRICAL STRUCTURE AND INCOMMENSURATE GROWTH - ULTRATHIN CU FILMS ON TIO2(110) [J].
MOLLER, PJ ;
WU, MC .
SURFACE SCIENCE, 1989, 224 (1-3) :265-276
[29]   ELECTRON-BEAM INDUCED CHARGING OF CU/MGO SURFACES [J].
MOLLER, PJ ;
HE, JW .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1986, 17 (02) :137-140
[30]   APPLICATION OF THE AUGER PARAMETER IN THE CHARACTERIZATION OF SMALL COPPER PARTICLES SUPPORTED ON INSULATORS [J].
MORETTI, G ;
PORTA, P .
SURFACE SCIENCE, 1993, 287 (pt B) :1076-1081