Influence of electron contamination on in vivo surface dosimetry for high-energy photon beams

被引:0
|
作者
Sjogren, R [1 ]
Karlsson, M [1 ]
机构
[1] Umea Univ, Dept Radiat Phys, S-90185 Umea, Sweden
关键词
in vivo dosimetry; electron contamination; patient diodes; semiconductor detectors;
D O I
暂无
中图分类号
R8 [特种医学]; R445 [影像诊断学];
学科分类号
1002 ; 100207 ; 1009 ;
摘要
The influence of the electron contamination at in vivo dosimetry with diodes on the patient surface has been investigated by introducing different accessories in the beam path and by changing the field size and SSD. The results show a clear correlation between the electron contamination at an effective measuring depth of the diode and the signal from the patient diode. When the electron contamination is taken into account the agreement between the diode values and the absorbed dose is greatly improved. More accurate in vivo dosimetry with less error margins is therefore possible if better predictions of the electron contamination in high-energy photon beams can be performed. (C) 1998 American Association of Physicists in Medicine. [S0094-2405(98)00606-3].
引用
收藏
页码:916 / 921
页数:6
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