X-ray fluorescence imaging

被引：13

作者：

Lider, V. V. ^{[1
]}

机构：

[1] Russian Acad Sci, Shubnikov Inst Crystallog, Fed Sci Res Ctr Crystallog & Photon, Leninskii Prosp 59, Moscow 119333, Russia

来源：

PHYSICS-USPEKHI | 2018年 / 61卷 / 10期

关键词：

X-rays; X-ray fluorescence; X-ray focusing optics; X-ray fluorescent microscopy; X-ray tomography; X-ray spectroscopy; synchrotron radiation; ABSORPTION NEAR-EDGE; CONFOCAL MU-XRF; MAPPING MA-XRF; WORKS-OF-ART; 3D MICRO-XRF; SYNCHROTRON-RADIATION; IN-SITU; TRACE-ELEMENT; CULTURAL-HERITAGE; CADMIUM YELLOW;

D O I：

10.3367/UFNe.2017.07.038174

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Over the past two decades, numerous X-ray micro-beam studies have been published addressing the nondestructive investigation of chemical element distribution in condensed heterogeneous media. Based on this literature, some aspects of the field are discussed in this paper, including X-ray focusing methods and various elemental imaging techniques: scanning and confocal X-ray fluorescence microscopy, full-field X-ray fluorescence microscopy, X-ray fluorescence tomography, and prospects for combining X-ray fluorescence imaging with other physical methods rested on using synchrotron radiation.

引用

页码：980 / 999

页数：20

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