Measurement of silicon dioxide surface phonon-polariton propagation length by attenuated total reflection

被引：54

作者：

Chen, Dye-Zone A. ^{[1
]}

Chen, Gang ^{[1
]}

机构：

[1] MIT, Dept Mech Engn, Cambridge, MA 02139 USA

来源：

APPLIED PHYSICS LETTERS | 2007年 / 91卷 / 12期

关键词：

D O I：

10.1063/1.2789177

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The authors present an experimental measurement of the propagation length of surface phonon-polaritons on amorphous silicon dioxide using the method of attenuated total reflection. The measurements yield a propagation length of 10.8 +/- 1.3 mu m for the silicon dioxide surface phonon-polariton resonance at 9 mu m, which is in good agreement with the calculated value.

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页数：3

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