DC current measurement circuit for on-chip applications

被引：0

作者：

Tam, CKL ^{[1
]}

Roberts, GW ^{[1
]}

机构：

[1] McGill Univ, Dept Elect & Comp Engn, Microelect & Comp Syst Lab, Montreal, PQ H3A 2A7, Canada

来源：

PROCEEDINGS OF THE 2003 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL I: ANALOG CIRCUITS AND SIGNAL PROCESSING | 2003年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A robust and highly scalable technique for measuring DC currents is described. The circuit consists largely of digital electronics except for a comparator and a passive RC filter. This simple structure is able to force a voltage at a circuit node while measuring the current that flows into it. The technique has been successfully demonstrated using a prototype constructed using a 0.35 mum CMOS chip.

引用

页码：101 / 104

页数：4

共 7 条

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