Automatic Fault Detection Circuit for Integrated Gate Drivers of Active-Matrix Displays

被引：2

作者：

Yu, Byung-Chang ^{[1
]}

Kim, Jongbin ^{[1
]}

Lee, Seung-Hyuck ^{[1
]}

Chung, Hoon-Ju ^{[2
]}

Lee, Seung-Woo ^{[1
]}

机构：

[1] Kyung Hee Univ, Adv Display Res Ctr, Dept Informat Display, Seoul 02447, South Korea

[2] Kumoh Natl Inst Technol, Sch Elect Engn, Gumi 39177, South Korea

来源：

IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY | 2019年 / 7卷 / 01期

基金：

新加坡国家研究基金会;

关键词：

Fault detection; stretchable display; gate driver circuits; FLEXIBLE AMOLED DISPLAY;

D O I：

10.1109/JEDS.2018.2885529

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents automatic fault detection circuit for integrated gate drivers. The proposed circuit consists of one capacitor and two TFTs per scan line. The circuit can detect three types of faults, such as line disconnection (LD), low voltage stuck (LVS), and high voltage stuck (HVS) for the gate driver due to external physical stress. Simulation results showed the proposed circuit operates well. In order to verify the circuit operation, it was fabricated with indium gallium zinc oxide thin film transistors process. The measurement results also verified that our proposed fault detection circuit could detect the types and locations of the LD and LVS of the gate driver successfully. However, we found that HVS can be detected, but further study is needed to accurately detect the position of HVS in the proposed circuit.

引用

页码：315 / 321

页数：7