Residual native shallow donor in ZnO

被引:1026
作者
Look, DC [1 ]
Hemsky, JW
Sizelove, JR
机构
[1] Wright State Univ, Semicond Res Ctr, Dayton, OH 45435 USA
[2] USAF, Res Lab, Wright Patterson AFB, OH 45433 USA
关键词
D O I
10.1103/PhysRevLett.82.2552
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
High-energy electron irradiation in ZnO produces shallow donors at about E-C - 30 meV. Because the production rate is much higher for Zn-face (0001) than O-face (000 (1) over bar) irradiation, the donor is identified as a Zn-sublattice defect, most likely the interstitial Zn-I or a Zn-I-related complex. The donor energy is quite close to that of the unirradiated sample, and of other samples discussed in the literature, strongly suggesting that Zn-I (and not V-o) is the dominant native shallow donor in ZnO. An exceptionally high displacement threshold energy (similar to 1.6 MeV) is quantitatively explained in terms of a multiple-displacement model. [S0031-9007(99)08717-7].
引用
收藏
页码:2552 / 2555
页数:4
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