Controlled growth of high-quality poly-silicon thin films with huge grains on glass substrates using an excimer laser

被引:15
作者
Zhang, FM [1 ]
Liu, XC [1 ]
Ni, G [1 ]
Du, YW [1 ]
机构
[1] Nanjing Univ, Dept Phys, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China
关键词
film materials; excimer laser crystallization; CVD;
D O I
10.1016/j.jcrysgro.2003.07.035
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
As the best results reported to date, high-quality poly-silicon thin film materials with huge grains have been fabricated on. large-area glass substrates using the technique of excimer laser re-crystallization. It has been shown that the nucleation and growth of grains in poly-silicon films were well controlled. A uniform distribution of grains has been achieved at room temperature for substrates. Using a substrate temperature of 650degreesC, films with grains over 60 mum have been demonstrated. The excellent quality of the re-crystallized films was demonstrated using the evidence from transmission electron microscopy and secondary ion mass spectroscopy, respectively. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:102 / 108
页数:7
相关论文
共 23 条
[1]  
ANDRA G, 1997, 26 PHOT SPEC C AN
[2]  
BERMANN RB, 1999, APPL PHYS A, V69, P187
[3]   POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS [J].
BROTHERTON, SD .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1995, 10 (06) :721-738
[4]  
Catchpole KR, 2001, SOL ENERG MAT SOL C, V68, P173, DOI 10.1016/S0927-0248(00)00246-4
[5]   Excimer laser crystallization techniques for polysilicon TFTs [J].
Fortunato, G ;
Mariucci, L ;
Carluccio, R ;
Pecora, A ;
Foglietti, V .
APPLIED SURFACE SCIENCE, 2000, 154 :95-104
[6]  
GARTNER M, 2002, SENSOR ACTUAT A-PHYS, V1, P3285
[7]   Microstructural characterization of solid-phase crystallized amorphous silicon films recrystallized using an excimer laser [J].
Giust, GK ;
Sigmon, TW .
APPLIED PHYSICS LETTERS, 1997, 70 (06) :767-769
[8]  
Givargizov E. I., 1991, ORIENTED CRYSTALLIZA
[9]   High mobility thin film transistors fabricated on a plastic substrate at a processing temperature of 110°C [J].
Gosain, DP ;
Noguchi, T ;
Usui, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2000, 39 (3AB) :L179-L181
[10]   Study on cat-CVD poly-Si films for solar cell application [J].
Iiduka, R ;
Heya, A ;
Matsumura, H .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 1997, 48 (1-4) :279-285