共 58 条
Structural and electronic properties of a van der Waals heterostructure based on silicene and gallium selenide: effect of strain and electric field
被引:78
作者:

Le, P. T. T.
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机构:
Ton Duc Thang Univ, Adv Inst Mat Sci, Theoret Phys Res Grp, Ho Chi Minh City, Vietnam
Ton Duc Thang Univ, Fac Sci Appl, Ho Chi Minh City, Vietnam Ton Duc Thang Univ, Adv Inst Mat Sci, Theoret Phys Res Grp, Ho Chi Minh City, Vietnam

Hieu, Nguyen N.
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机构:
Duy Tan Univ, Inst Res & Dev, Da Nang 550000, Vietnam Ton Duc Thang Univ, Adv Inst Mat Sci, Theoret Phys Res Grp, Ho Chi Minh City, Vietnam

Bui, Le M.
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机构:
Nguyen Tat Thanh Univ, NTT Hitech Inst, Ho Chi Minh City, Vietnam Ton Duc Thang Univ, Adv Inst Mat Sci, Theoret Phys Res Grp, Ho Chi Minh City, Vietnam

Phuc, Huynh V.
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机构:
Dong Thap Univ, Div Theoret Phys, Dong Thap, Vietnam Ton Duc Thang Univ, Adv Inst Mat Sci, Theoret Phys Res Grp, Ho Chi Minh City, Vietnam

Hoi, Bui D.
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机构:
Hue Univ, Univ Educ, Dept Phys, Hue, Vietnam Ton Duc Thang Univ, Adv Inst Mat Sci, Theoret Phys Res Grp, Ho Chi Minh City, Vietnam

Amin, B.
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机构:
Hazara Univ, Dept Phys, Mansehra 21300, Pakistan Ton Duc Thang Univ, Adv Inst Mat Sci, Theoret Phys Res Grp, Ho Chi Minh City, Vietnam

Nguyen, Chuong V.
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h-index: 0
机构:
Le Quy Don Tech Univ, Dept Mat Sci & Engn, Hanoi 100000, Vietnam Ton Duc Thang Univ, Adv Inst Mat Sci, Theoret Phys Res Grp, Ho Chi Minh City, Vietnam
机构:
[1] Ton Duc Thang Univ, Adv Inst Mat Sci, Theoret Phys Res Grp, Ho Chi Minh City, Vietnam
[2] Ton Duc Thang Univ, Fac Sci Appl, Ho Chi Minh City, Vietnam
[3] Duy Tan Univ, Inst Res & Dev, Da Nang 550000, Vietnam
[4] Nguyen Tat Thanh Univ, NTT Hitech Inst, Ho Chi Minh City, Vietnam
[5] Dong Thap Univ, Div Theoret Phys, Dong Thap, Vietnam
[6] Hue Univ, Univ Educ, Dept Phys, Hue, Vietnam
[7] Hazara Univ, Dept Phys, Mansehra 21300, Pakistan
[8] Le Quy Don Tech Univ, Dept Mat Sci & Engn, Hanoi 100000, Vietnam
关键词:
GAS;
GRAPHENE;
EPITAXY;
RANGE;
D O I:
10.1039/c8cp05588b
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
Combining van der Waals heterostructures by stacking different two-dimensional materials on top of each other layer-by-layer can enhance their desired properties and greatly extend the applications of the parent materials. In this work, by means of first principles calculations, we investigate systematically the structural and electronic properties of six different stacking configurations of a Si/GaSe heterostructure. The effect of biaxial strain and electric field on the electronic properties of the most energetically stable configuration of the Si/GaSe heterostructure has also been discussed. At the equilibrium state, the electronic properties of the Si/GaSe heterostructure in all its stacking configurations are well kept as compared with that of single layers owing to their weak van der Waals interactions. Interestingly, we find that a sizable band gap is opened at the Dirac K point of silicene in the Si/GaSe heterostructure, which could be further controlled by biaxial strain or electric field. These findings open up a possibility for designing silicene-based electronic devices, which exhibit a controllable band gap. Furthermore, the Si/GaSe heterostructure forms an n-type Schottky contact with a small Schottky barrier height of 0.23 eV. A transformation from the n-type Schottky contact to a p-type one, or from the Schottky contact to an ohmic contact may occur in the Si/GaSe heterostructure when strain or an electric field is applied.
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页码:27856 / 27864
页数:9
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Chinese Acad Sci, Inst Semicond, State Key Lab Superlattice & Microstruct, Beijing 100083, Peoples R China Chinese Acad Sci, Inst Semicond, State Key Lab Superlattice & Microstruct, Beijing 100083, Peoples R China

Li, Jingbo
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Chinese Acad Sci, Inst Semicond, State Key Lab Superlattice & Microstruct, Beijing 100083, Peoples R China Chinese Acad Sci, Inst Semicond, State Key Lab Superlattice & Microstruct, Beijing 100083, Peoples R China