Mitigation of Radiation Effects in SRAM-Based FPGAs for Space Applications

被引：91
作者：
Siegle, Felix [1 ]
Vladimirova, Tanya [1 ]
Ilstad, Jorgen [2 ]
Emam, Omar [3 ]
机构：
[1] Univ Leicester, Embedded Syst Grp, Leicester LE1 7RH, Leics, England
[2] ESA ESTEC, Noordwijk, Netherlands
[3] Airbus Def & Space, Stevenage, Herts, England
来源：
ACM COMPUTING SURVEYS | 2015年 / 47卷 / 02期
关键词：
Design; Reliability; Dynamic partial reconfiguration; fault injection; FPGA; hot redundancy; information redundancy; radiation effects; scrubbing; single event upsets; spatial redundancy; triplemodular redundancy; REDUCED-PRECISION REDUNDANCY; SINGLE-EVENT TRANSIENTS; SOFT ERROR MITIGATION; PARTIAL RECONFIGURATION; SEU; DESIGN; ALGORITHM; TMR; ARCHITECTURES; PROPAGATION;
D O I：
10.1145/2671181
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
The use of static random access memory (SRAM)-based field programmable gate arrays (FPGAs) in harsh radiation environments has grown in recent years. These types of programmable devices require special mitigation techniques targeting the configuration memory, the user logic, and the embedded RAM blocks. This article provides a comprehensive survey of the literature published in this rich research field during the past 10 years. Furthermore, it can also serve as a tutorial for space engineers, scientists, and decision makers who need an introduction to this topic.
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页数：34
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