Vibrations of free and surface-coupled atomic force microscope cantilevers: Theory and experiment

被引:578
作者
Rabe, U
Janser, K
Arnold, W
机构
[1] Fraunhofer Inst. for Nondestr. Test., University
关键词
D O I
10.1063/1.1147409
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
With an optical interferometer, the free vibration spectra and the local, vibration amplitude of four rectangular atomic force microscope cantilevers made of silicon have been examined experimentally in a spectral range of 100 kHz to 10 MHz. A good agreement with the flexural wave theory of elastic beams was found. Coupling to torsional vibrations was also observed. When the sensor tip of the cantilever is in contact with a sample surface the resonances are shifted in frequency and the vibration amplitudes along the cantilever change. A method is presented to calculate this frequency shift using a linear approximation for the tip-sample interaction forces, and the results are compared with the frequency shift calculated from the point-mass model. The measured resonance frequencies' of a surface-coupled cantilever do not correspond as well to the theoretical ones as in the free case even if the elastic-beam model is used. The reason for the disagreement is found to be the geometry of the commercial cantilevers and the nonlinearity of the tip-sample interaction force. (C) 1996 American Institute of Physics.
引用
收藏
页码:3281 / 3293
页数:13
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