A new patterning method for microstructural strain mapping of Al-5754 alloy using image correlation

被引：2

作者：

Nagarajan, S. ^{[1
]}

Prakash, R. ^{[1
]}

机构：

[1] Indian Inst Technol Madras, Dept Mech Engn, Madras 600036, Tamil Nadu, India

来源：

EXPERIMENTAL TECHNIQUES | 2018年 / 42卷 / 04期

关键词：

Aluminum alloy; Digital image correlation; Microstructural strain map; Randomdot pattern; Chemical etching; SPECKLE PATTERNS; MAGNESIUM ALLOY; ALUMINUM-ALLOYS; SOLIDIFICATION; LOCALIZATION;

D O I：

10.1007/s40799-018-0252-3

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

A new, simple chemical etching based surface patterning method for microstructural strain mapping of Al-5754 alloy is proposed. This method reveals the grain boundaries and micro-constituents of the alloy which can serve as high contrast random dot pattern for microstructural strain calculation using digital image correlation. The suitability of the surface pattern developed by this method to accurately map the microstructural strain evolution during tensile deformation with adequate spatial resolution to address intragranular strain heterogeneities has been quantitatively assessed and demonstrated.

引用

页码：453 / 458

页数：6

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