Identification of thin plates seen in R5(SixGe1-x)4 alloys, where R is Gd, Tb, Dy, and Er

被引：15

作者：

Ugurlu, O ^{[1
]}

Chumbley, LS

Schlagel, DL

Lograsso, TA

Tsokol, AO

机构：

[1] Iowa State Univ Sci & Technol, Ames Lab, Ames, IA 50011 USA

[2] Iowa State Univ Sci & Technol, Dept Mat Sci & Engn, Ames, IA 50011 USA

来源：

SCRIPTA MATERIALIA | 2005年 / 53卷 / 03期

关键词：

scanning electron microscopy (SEM); transmission electron microscopy (TEM); rare earth; microstructure; Gd-5(Si-x; Ge1-x)(4);

D O I：

10.1016/j.scriptamat.2005.03.052

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

R-5(SixGe1-x)(4) alloys, where R is Tb, Dy, and Er, have been examined. Their microstructures consisted of large grains with thin plates of a second phase. Energy dispersive spectrometry of the plates revealed a rare earth rich composition. It is proposed that the plates are R-5(SixGe1-x)(3) compounds, similar to results seen in Gd-5(SixGe1-x)(4). Published by Elsevier Ltd. on behalf of Acta Materialia Inc.

引用

页码：373 / 377

页数：5

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