Identification of thin plates seen in R5(SixGe1-x)4 alloys, where R is Gd, Tb, Dy, and Er

被引：15
作者：
Ugurlu, O [1 ]
Chumbley, LS
Schlagel, DL
Lograsso, TA
Tsokol, AO
机构：
[1] Iowa State Univ Sci & Technol, Ames Lab, Ames, IA 50011 USA
[2] Iowa State Univ Sci & Technol, Dept Mat Sci & Engn, Ames, IA 50011 USA
来源：
SCRIPTA MATERIALIA | 2005年 / 53卷 / 03期
关键词：
scanning electron microscopy (SEM); transmission electron microscopy (TEM); rare earth; microstructure; Gd-5(Si-x; Ge1-x)(4);
D O I：
10.1016/j.scriptamat.2005.03.052
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
R-5(SixGe1-x)(4) alloys, where R is Tb, Dy, and Er, have been examined. Their microstructures consisted of large grains with thin plates of a second phase. Energy dispersive spectrometry of the plates revealed a rare earth rich composition. It is proposed that the plates are R-5(SixGe1-x)(3) compounds, similar to results seen in Gd-5(SixGe1-x)(4). Published by Elsevier Ltd. on behalf of Acta Materialia Inc.
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收藏
页码：373 / 377
页数：5
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