Influence of process parameters on the microstructure of scandium films deposited by electron-beam evaporation

被引:4
作者
Wu, Qingying [1 ]
Bing, Wenzeng [1 ]
Long, Xinggui [1 ]
Zhou, Xiaosong [1 ]
Liu, Jinhua [1 ]
Luo, Shunzhong [1 ]
机构
[1] China Acad Engn Phys, Inst Nucl Phys & Chem, Mianyang 621900, Peoples R China
基金
中国国家自然科学基金;
关键词
Scandium film; Electron-beam evaporation; Substrate temperature; Deposition rate; Microstructure; OPTICAL-PROPERTIES; SURFACE-ENERGY; HCP-METALS;
D O I
10.1016/j.vacuum.2011.12.023
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Microstructures of scandium films deposited on molybdenum (Mo) substrates by electron-beam evaporation are investigated. Influences of substrate temperatures and deposition rates are considered. It is found that the microstructural changes of scandium films with the substrate temperatures are consistent with the reported structure-zone models. Sc films, deposited at 5 nm/s with the temperature range of 373-923 K. as well as deposited at 923 K with the deposition rate from 0.5 to 5 nm/s, show a (002) preferred orientation. Both the texture coefficients of (002) peaks and the grain sizes increase with the substrate temperature. For films deposited at various deposition rates, the films show smoother surfaces at the lower deposition rate. Moreover, the grain sizes first increase with the increasing deposition rate and then decrease with it. The largest grain size (similar to 246 nm) is obtained at the deposition rate of 5 nm/s. The texture coefficients of the (002) preferred orientation decrease when the deposition rate increases from 0.5 nm/s to 5 nm/s. And the preferred growth of the film disappears at deposition rate of 10 nm/s. (C) 2012 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1347 / 1352
页数:6
相关论文
共 19 条
  • [1] Influence of substrate temperature on microcrystalline structure and optical properties of ZnTe thin films
    Amutha, R.
    Subbarayan, A.
    Sathyamoorthy, R.
    [J]. CRYSTAL RESEARCH AND TECHNOLOGY, 2006, 41 (12) : 1174 - 1179
  • [2] Structural characterizations of magnetron sputtered nanocrystalline TiN thin films
    Chawla, Vipin
    Jayaganthan, R.
    Chandra, Ramesh
    [J]. MATERIALS CHARACTERIZATION, 2008, 59 (08) : 1015 - 1020
  • [3] Nanowires of four epitaxial hexagonal silicides grown on Si(001)
    Chen, Y
    Ohlberg, DAA
    Williams, RS
    [J]. JOURNAL OF APPLIED PHYSICS, 2002, 91 (05) : 3213 - 3218
  • [4] David P. A., SAND20021466
  • [5] David PA, SAND20011629
  • [6] Calculation of the surface energy of hcp-metals with the empirical electron theory
    Fu, Bao-Qin
    Liu, Wei
    Li, Zhi-Lin
    [J]. APPLIED SURFACE SCIENCE, 2009, 255 (23) : 9348 - 9357
  • [7] Gorodeskii D. A., 1980, Soviet Physics - Crystallography, V25, P377
  • [8] Gorodetskii D. A., 1968, Fizika Tverdogo Tela, V10, P2302
  • [9] THE DEVELOPMENT OF GRAIN-STRUCTURE DURING GROWTH OF METALLIC-FILMS
    GROVENOR, CRM
    HENTZELL, HTG
    SMITH, DA
    [J]. ACTA METALLURGICA, 1984, 32 (05): : 773 - 781
  • [10] A QUANTITATIVE MODEL FOR THE EVOLUTION FROM RANDOM ORIENTATION TO A UNIQUE TEXTURE IN PVD THIN-FILM GROWTH
    KNUYT, G
    QUAEYHAEGENS, C
    DHAEN, J
    STALS, LM
    [J]. THIN SOLID FILMS, 1995, 258 (1-2) : 159 - 169