Photoionized plasmas induced in neon with extreme ultraviolet and soft X-ray pulses produced using low and high energy laser systems

被引:23
作者
Bartnik, A. [1 ]
Wachulak, P. [1 ]
Fok, T. [1 ]
Wergrzynski, L. [1 ]
Fiedorowicz, H. [1 ]
Pisarczyk, T. [2 ]
Chodukowski, T. [2 ]
Kalinowska, Z. [2 ]
Dudzak, R. [3 ,4 ]
Dostal, J. [3 ,4 ]
Krousky, E. [3 ,4 ]
Skala, J. [3 ,4 ]
Ullschmied, J. [3 ,4 ]
Hrebicek, J. [3 ,4 ]
Medrik, T. [3 ,4 ]
机构
[1] Mil Univ Technol, Inst Optoelect, PL-00908 Warsaw, Poland
[2] Inst Plasma Phys & Laser Microfus, PL-00908 Warsaw, Poland
[3] Inst Plasma Phys ASCR, Prague, Czech Republic
[4] Inst Phys ASCR, Prague, Czech Republic
关键词
CROSS-SECTIONS; EUV; RADIATION; DRIVEN;
D O I
10.1063/1.4919024
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
A comparative study of photoionized plasmas created by two soft X-ray and extreme ultraviolet (SXR/EUV) laser plasma sources with different parameters is presented. The two sources are based on double-stream Xe/He gas-puff targets irradiated with high (500 J/0.3 ns) and low energy (10 J/1 ns) laser pulses. In both cases, the SXR/EUV beam irradiated the gas stream, injected into a vacuum chamber synchronously with the radiation pulse. Irradiation of gases resulted in formation of photoionized plasmas emitting radiation in the SXR/EUV range. The measured Ne plasma radiation spectra are dominated by emission lines corresponding to radiative transitions in singly charged ions. A significant difference concerns origin of the lines: K-shell or L-shell emissions occur in case of the high and low energy irradiating system, respectively. In high energy system, the electron density measurements were also performed by laser interferometry, employing a femtosecond laser system. A maximum electron density for Ne plasma reached the value of 2.10(18) cm(-3). For the low energy system, a detection limit was too high for the interferometric measurements, thus only an upper estimation for electron density could be made. (C) 2015 AIP Publishing LLC.
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页数:9
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