The Role of Electrochemical Phenomena in Scanning Probe Microscopy of Ferroelectric Thin Films

被引：106

作者：

Kalinin, Sergei V. ^{[1
]}

Jesse, Stephen ^{[1
]}

Tselev, Alexander ^{[1
]}

Baddorf, Arthur P. ^{[1
]}

Balke, Nina ^{[1
]}

机构：

[1] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA

来源：

ACS NANO | 2011年 / 5卷 / 07期

关键词：

scanning probe microscopy; ferroelectric thin films; electrochemical phenomena; oxides; CHEMICAL EXPANSION; SURFACE; POLARIZATION; CHARGE; PIEZORESPONSE; TRANSITION; TRANSPORT; WATER;

D O I：

10.1021/nn2013518

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Applications of piezoresponse force microscopy and conductive atomic force microscopy to ferroelectric thin films necessitate understanding of the possible bias-induced electrochemical reactivity of oxide surfaces. These range from reversible Ionic surface charging (possibly coupled to polarization) and vacancy and proton injection to partially reversible vacancy ordering, to irreversible electrochemical degradation of the film and bottom electrode. Here, the electrochemical phenomena induced by a biased tip are analyzed and both theoretical and experimental criteria for their identification are summarized.

引用

页码：5683 / 5691

页数：9

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[1] Factors governing oxygen reduction in solid oxide fuel cell cathodes [J].