Scanning soft X-ray spectromicroscopy at the Pohang Light Source: commissioning results

被引：20

作者：

Shin, HJ ^{[1
]}

Lee, MK ^{[1
]}

机构：

[1] POSTECH, Pohang Accelerator Lab, Beamline Dept, Pohang 790784, South Korea

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2001年 / 467卷

关键词：

spectromicroscopy; SPEM; STXM; X-ray microscopy;

D O I：

10.1016/S0168-9002(01)00517-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A scanning spectromicroscopy facility has been installed at the undulator radiation beamline at the Pohang Light Source. The spectromicroscopy is operational in both the scanning transmission X-ray microscopy (STXM) and the scanning photoelectron microscopy (SPEM) modes. Currently, the measured X-ray spot size on the sample is about 0.4 mum. The effective photon energy range of the STXM is 250- 1000 eV and that of the SPEM is 400-1000 eV. The performance of the facility is presented in this report. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：909 / 912

页数：4

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