High-energy refocused Laue method: Analytic technique for volumetric study of single crystals

被引:13
作者
Bastie, P [1 ]
Hamelin, B [1 ]
机构
[1] INST MAX VON LAUE PAUL LANGEVIN,F-38042 GRENOBLE 09,FRANCE
来源
JOURNAL DE PHYSIQUE IV | 1996年 / 6卷 / C4期
关键词
D O I
10.1051/jp4:1996402
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Using high voltage X-ray generators (typically 400 kV) and two dimensional detectors from the industrial radiography, a variant of the Laue method has been transposed for high energy radiations. By this way. a laboratory diffractometer has been built which allows us to study bulk properties of large single crystals with thickness of several centimeters, practically in real time. The first results prove the feasibility and the sensitivity of the method, show possible uses of this technique and open interesting opportunities for basic research such as phase transition studies, for]age single crystal bulk characterisation and also non destructive testing.
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页码:13 / 21
页数:9
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